Inventor · disambiguated record
Mohamed Azimane
Also filed as: AZIMANE MOHAMED
6 granted patents·1 pending application·25 citations·filing 2004–2021
77Inventor score
Technology areasG11C
Top patents by PatentIndex Score
7 records- 0186US11435940B2Testing a memory which includes conservative reversible logicNXP BV·Filed 2021·Granted Sep 6, 2022·2 cites·20 claims
- 0272US7463508B2SRAM test method and SRAM test arrangement to detect weak cellsNXP BV·Filed 2005·Granted Dec 9, 2008·10 cites·11 claims
- 0345US7392465B2Testing ram address decoder for resistive open defectsNXP BV·Filed 2004·Granted Jun 24, 2008·8 cites·7 claims
- 0443US7689878B2System and method for testing defects in an electronic circuitNXP BV·Filed 2004·Granted Mar 30, 2010·5 cites·10 claims
- 0534US7885093B2Method for testing a static random access memoryNXP BV·Filed 2007·Granted Feb 8, 2011·0 cites·6 claims
- 0630US7536610B2Method for detecting resistive-open defects in semiconductor memoriesKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted May 19, 2009·0 cites·19 claims
- 0721US2007257716A1Dft Technique for Stressing Self-Timed Semiconductor Memories to Detect Delay FaultsAZIMANE MOHAMED·Filed 2005·Application pending·0 cites
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