Inventor · disambiguated record
Jeong-Ho Bang
Also filed as: BANG JEONG-HO
42 granted patents·7 pending applications·501 citations·filing 1995–2023
98Inventor score
Files withSAMSUNG ELECTRONICS CO LTD40HYNIX SEMICONDUCTOR INC2INTEGRATED SILICON SOLUTION INC2ELECTRONICS & TELECOMMUNICATIONS RES INST1HYUNDAI ELECTRONICS IND1
Top patents by PatentIndex Score
49 records- 0193US6121118AChip separation device and methodSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Sep 19, 2000·149 cites·19 claims
- 0286US6489790B1Socket including pressure conductive rubber and mesh for testing of ball grid array packageSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 3, 2002·39 cites·20 claims
- 0380US6373309B1Duty cycle compensation circuit of delay locked loop for Rambus DRAMHYUNDAI ELECTRONICS IND·Filed 2000·Granted Apr 16, 2002·28 cites·8 claims
- 0478US6903567B2Test apparatus having multiple test sites at one handler and its test methodSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 7, 2005·17 cites·3 claims
- 0576US7378864B2Test apparatus having multiple test sites at one handler and its test methodSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted May 27, 2008·4 cites·4 claims
- 0675US7438563B2Connector for testing a semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 21, 2008·9 cites·32 claims
- 0774US7230417B2Test system of semiconductor device having a handler remote control and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jun 12, 2007·5 cites·23 claims
- 0873US8018899B2Handoff system and method between different kinds of devices, SIP server and operational method of SIP serverSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 13, 2011·7 cites·22 claims
- 0972US6462534B2Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewithSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Oct 8, 2002·20 cites·16 claims
- 1070US7084655B2Burn-in test apparatus for BGA packages using forced heat exhaustSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Aug 1, 2006·15 cites·16 claims
- 1170US5621625ASurge protection circuit for a switching mode power supplySAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Apr 15, 1997·40 cites·10 claims
- 1263US7602172B2Test apparatus having multiple head boards at one handler and its test methodSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Oct 13, 2009·1 cites·4 claims
- 1363US6960908B2Method for electrical testing of semiconductor package that detects socket defects in real timeSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Nov 1, 2005·14 cites·13 claims
- 1462US7492032B2Fuse regions of a semiconductor memory device and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 17, 2009·4 cites·17 claims
- 1561US9426890B2Display apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Aug 23, 2016·1 cites·15 claims
- 1660US6686929B2Broadband switching drive compensating circuit for a video display deviceSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Feb 3, 2004·4 cites·16 claims
- 1759US7327154B2Multichip package testSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 5, 2008·3 cites·4 claims
- 1859US2023252333A1Method and apparatus for processing and measuring photonic qubit signalsELECTRONICS & TELECOMMUNICATIONS RES INST·Filed 2023·Application pending·0 cites
- 1958US6850450B2Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cellSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Feb 1, 2005·10 cites·15 claims
- 2058US6813195B2Pipe latch circuit for outputting data with high speedHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Nov 2, 2004·10 cites·6 claims
- 2158US6710550B2Plasma display panel apparatus and method of protecting an over current thereofSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 23, 2004·5 cites·20 claims
- 2258US6507801B1Semiconductor device testing systemSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jan 14, 2003·6 cites·20 claims
- 2357US7254757B2Flash memory test system and method capable of test time reductionSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Aug 7, 2007·7 cites·19 claims
- 2457US7227351B2Apparatus and method for performing parallel test on integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 5, 2007·11 cites·20 claims
- 2555US7017428B2Test kit for semiconductor package and method for testing semiconductor package using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Mar 28, 2006·5 cites·25 claims
- 2655US6861682B2Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 1, 2005·7 cites·14 claims
- 2754US6943577B2Multichip package testSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 13, 2005·6 cites·2 claims
- 2852US5870086APower saving display device and method for controlling power thereofSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Feb 9, 1999·26 cites·13 claims
- 2950US7408339B2Test system of semiconductor device having a handler remote control and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 5, 2008·1 cites·12 claims
- 3050US6842031B2Method of electrically testing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 11, 2005·7 cites·15 claims
- 3147US12260930B2Memory core characteristic screening method and system thereofINTEGRATED SILICON SOLUTION INC·Filed 2022·Granted Mar 25, 2025·0 cites·20 claims
- 3247US12183411B2Memory interface circuitry and built-in self-testing methodINTEGRATED SILICON SOLUTION INC·Filed 2023·Granted Dec 31, 2024·0 cites·16 claims
- 3347US6841425B2Wafer treatment method for protecting fuse box of semiconductor chipSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jan 11, 2005·3 cites·7 claims
- 3446US6700337B2Apparatus for generating dynamic focus signalSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 2, 2004·0 cites·11 claims
- 3544US6922050B2Method for testing a remnant batch of semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 26, 2005·1 cites·12 claims
- 3641US6201746B1Test method for high speed memory devices in which limit conditions for the clock are definedSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Mar 13, 2001·9 cites·20 claims
- 3740US6337695B1Circuit for controlling a contrast level and compensating a brightness level of a video display apparatus and method thereforSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jan 8, 2002·7 cites·13 claims
- 3838US2002092910A1Method and apparatus for detecting defective markings on a semiconductor productSAMSUNG ELECTRONICS CO LTD·Filed 2001·Application pending·0 cites
- 3937US6183589B1Method for manufacturing lead-on-chip (LOC) semiconductor packages using liquid adhesive applied under the leadsSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Feb 6, 2001·7 cites·18 claims
- 4037US5780978AVertical focusing circuitSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jul 14, 1998·5 cites·20 claims
- 4137US2015212378A1Display device and manufacturing method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
- 4236US2006187647A1Test kit semiconductor package and method of testing semiconductor package using the sameIY HYUN-GUEN·Filed 2006·Application pending·0 cites
- 4334US6879541B2Integrated circuit with improved output control signal and method for generating improved output control signalHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Apr 12, 2005·0 cites·27 claims
- 4434US5942861AFront/back porch voltage-regulator of vertical focus control signalSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Aug 24, 1999·4 cites·14 claims
- 4534US2004145387A1Integrated monitoring burn-in test method for multi-chip packageFiled 2004·Application pending·0 cites
- 4630US6005357AVertical oscillation circuit for display deviceSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Dec 21, 1999·0 cites·9 claims
- 4730US5940413AMethod for detecting operational errors in a tester for semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Aug 17, 1999·4 cites·20 claims
- 4829US2003115519A1Parallel testing system for semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2002·Application pending·0 cites
- 4927US2006085715A1Test board of semiconductor tester having modified input/output printed circuit pattern and testing method using the sameKIM YONG-WOON·Filed 2005·Application pending·0 cites
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