Inventor · disambiguated record
Hendrikus Petrus Elisabeth Vranken
Also filed as: VRANKEN HENDRIKUS P E · VRANKEN HENDRIKUS PETRUS ELISA · VRANKEN HENDRIKUS PETRUS ELISABETH
8 granted patents·37 citations·filing 2000–2006
82Inventor score
Files withNXP BV4KONINKL PHILIPS ELECTRONICS NV1MARINISSEN ERIK J1NIEUWLAND ANDRE K1VRANKEN HENDRIKUS PETRUS ELISABETH1
Top patents by PatentIndex Score
8 records- 0171US7376873B2Method and system for selectively masking test responsesNXP BV·Filed 2004·Granted May 20, 2008·16 cites·9 claims
- 0268US9041411B2Testing of an integrated circuit that contains secret informationMARINISSEN ERIK J·Filed 2006·Granted May 26, 2015·8 cites·13 claims
- 0361US8539292B2Testing of an integrated circuit that contains secret informationNIEUWLAND ANDRE K·Filed 2006·Granted Sep 17, 2013·6 cites·16 claims
- 0443US7558994B2Methods and apparatus for data compressionNXP BV·Filed 2004·Granted Jul 7, 2009·3 cites·15 claims
- 0542US7124340B2Low pin count, high-speed boundary scan testingKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Oct 17, 2006·4 cites·6 claims
- 0640US7293258B1Data processor and method for using a data processor with debug circuitNXP BV·Filed 2000·Granted Nov 6, 2007·0 cites·6 claims
- 0739US7945828B2Integrated circuit arrangement and design methodNXP BV·Filed 2006·Granted May 17, 2011·0 cites·14 claims
- 0831US8281197B2Integrated circuit test method and test apparatusVRANKEN HENDRIKUS PETRUS ELISABETH·Filed 2006·Granted Oct 2, 2012·0 cites·20 claims
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