Inventor · disambiguated record
Yi-Chung Sheng
Also filed as: SHENG YI-CHUNG
49 granted patents·5 pending applications·456 citations·filing 1994–2024
98Inventor score
Files withUNITED MICROELECTRONICS CORP46HUANG JEN-HONG2CHANG CHU-CHUN1CHEN CHUN-CHIA1LIANG CHIA-WEN1
Top patents by PatentIndex Score
54 records- 0197US11296214B2High electron mobility transistor (HEMT) and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 5, 2022·18 cites·12 claims
- 0295US10256155B1Method for fabricating single diffusion break structure directly under a gate lineUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 9, 2019·16 cites·20 claims
- 0391US7342284B2Semiconductor MOS transistor device and method for making the sameUNITED MICROELECTRONICS CORP·Filed 2006·Granted Mar 11, 2008·16 cites·25 claims
- 0489US10867999B2Semiconductor device and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Dec 15, 2020·5 cites·20 claims
- 0589US2025107101A1Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0688US12200947B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2023·Granted Jan 14, 2025·0 cites·7 claims
- 0788US11631761B2High electron mobility transistor (HEMT) and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2022·Granted Apr 18, 2023·1 cites·7 claims
- 0887US11316031B2Method of forming fin forced stack inverterUNITED MICROELECTRONICS CORP·Filed 2020·Granted Apr 26, 2022·2 cites·7 claims
- 0987US8278166B2Method of manufacturing complementary metal oxide semiconductor deviceCHEN CHUN-CHIA·Filed 2010·Granted Oct 2, 2012·12 cites·12 claims
- 1086US5904540AMethod for manufacturing shallow trench isolationUNITED MICROELECTRONICS CORP·Filed 1997·Granted May 18, 1999·84 cites·25 claims
- 1184US5981404AMultilayer ONO structureUNITED MICROELECTRONICS CORP·Filed 1997·Granted Nov 9, 1999·88 cites·7 claims
- 1282US11895847B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2022·Granted Feb 6, 2024·0 cites·7 claims
- 1373US11705512B2High electron mobility transistor (HEMT) and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jul 18, 2023·0 cites·8 claims
- 1473US8207043B2Method for fabricating a semiconductor deviceLIN HUANG-YI·Filed 2009·Granted Jun 26, 2012·7 cites·20 claims
- 1570US11532666B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2021·Granted Dec 20, 2022·0 cites·8 claims
- 1670US8673755B2Semiconductor device having metal gate and manufacturing method thereofCHANG CHU-CHUN·Filed 2011·Granted Mar 18, 2014·4 cites·25 claims
- 1769US10991757B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 27, 2021·1 cites·8 claims
- 1868US6127212AMethod of forming a CMOS transistorUNITED MICROELECTRONICS CORP·Filed 2000·Granted Oct 3, 2000·17 cites·19 claims
- 1967US10247774B2Test key structure and method of measuring resistance of viasUNITED MICROELECTRONICS CORP·Filed 2016·Granted Apr 2, 2019·1 cites·19 claims
- 2067US5585297AMethod of manufacture of multi-state mask ROM and multi-state mask ROM device produced therebyUNITED MICROELECTRONICS CORP·Filed 1995·Granted Dec 17, 1996·23 cites·15 claims
- 2166US7508053B2Semiconductor MOS transistor device and method for making the sameUNITED MICROELECTRONICS CORP·Filed 2007·Granted Mar 24, 2009·2 cites·23 claims
- 2264US5545580AMulti-state read-only memory using multiple polysilicon selective depositionsUNITED MICROELECTRONICS CORP·Filed 1995·Granted Aug 13, 1996·20 cites·10 claims
- 2360US11296036B2Mark pattern in semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2020·Granted Apr 5, 2022·0 cites·15 claims
- 2460US5668031AMethod of fabricating high density flat cell mask ROMUNITED MICROELECTRONICS CORP·Filed 1996·Granted Sep 16, 1997·18 cites·5 claims
- 2558US8624398B2Semiconductor circuit structureSUN CHIA-CHEN·Filed 2009·Granted Jan 7, 2014·2 cites·12 claims
- 2657US10580883B21-1 fin forced stack inverterUNITED MICROELECTRONICS CORP·Filed 2018·Granted Mar 3, 2020·0 cites·5 claims
- 2756US5504030AProcess for fabricating high-density mask ROM devicesUNITED MICROELECTRONICS CORP·Filed 1995·Granted Apr 2, 1996·21 cites·9 claims
- 2855US5854109ASilicide process for manufacturing a mask ROMUNITED MICROELECTRONICS CORP·Filed 1997·Granted Dec 29, 1998·14 cites·10 claims
- 2955US5597753ACVD oxide coding method for ultra-high density mask read-only-memory (ROM)UNITED MICROELECTRONICS CORP·Filed 1994·Granted Jan 28, 1997·17 cites·25 claims
- 3054US7749833B2Semiconductor MOS transistor device and method for making the sameUNITED MICROELECTRONICS CORP·Filed 2009·Granted Jul 6, 2010·0 cites·27 claims
- 3153US8850370B2Method of manufacturing semiconductor circuit structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 30, 2014·0 cites·18 claims
- 3253US5536669AMethod for fabricating read-only-memory devices with self-aligned code implantsUNITED MICROELECTRONICS CORP·Filed 1995·Granted Jul 16, 1996·12 cites·12 claims
- 3352US10700126B2Magnetoresistive random access memory wherein number of memory cells in each string is equal to number of strings connected in parallelUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jun 30, 2020·0 cites·19 claims
- 3451US10692928B1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jun 23, 2020·0 cites·16 claims
- 3551US10529707B2Intra-metal capacitor and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 7, 2020·0 cites·10 claims
- 3651US7932104B2Method for inspecting photoresist patternUNITED MICROELECTRONICS CORP·Filed 2009·Granted Apr 26, 2011·0 cites·15 claims
- 3749US6544849B2Method of fabricating semiconductor device for preventing polysilicon line being damaged during removal of photoresistUNITED MICROELECTRONICS CORP·Filed 2001·Granted Apr 8, 2003·4 cites·20 claims
- 3847US10777508B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Sep 15, 2020·0 cites·18 claims
- 3947US10002864B1Intra-metal capacitor and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 19, 2018·0 cites·19 claims
- 4047US5891779AMethod of fabricating tetra-state mask read only memoryUNITED MICROELECTRONICS CORP·Filed 1998·Granted Apr 6, 1999·9 cites·15 claims
- 4143US5846865AMethod of fabricating flat-cell mask read-only memory (ROM) devicesUNITED MICROELECTRONICS CORP·Filed 1996·Granted Dec 8, 1998·10 cites·12 claims
- 4243US2007087542A1Method of forming a silicideHUANG JEN-HONG·Filed 2006·Application pending·0 cites
- 4342US7550356B2Method of fabricating strained-silicon transistorsUNITED MICROELECTRONICS CORP·Filed 2005·Granted Jun 23, 2009·1 cites·7 claims
- 4441US2007042584A1Method of forming a silicideHUANG JEN-HONG·Filed 2005·Application pending·0 cites
- 4539US6103606AMethod of fabricating a word lineUNITED MICROELECTRONICS CORP·Filed 1996·Granted Aug 15, 2000·8 cites·9 claims
- 4639US5668030AProcess for making identification alphanumeric code markings for mask ROM devicesUNITED MICROELECTRONICS CORP·Filed 1995·Granted Sep 16, 1997·8 cites·8 claims
- 4738US2013277754A1Semiconductor Integrated StructureLIANG CHIA-WEN·Filed 2012·Application pending·0 cites
- 4836US5693551AMethod for fabricating a tri-state read-only memory deviceUNITED MICROELECTRONICS CORP·Filed 1995·Granted Dec 2, 1997·4 cites·12 claims
- 4936US5654576APost-titanium nitride mask ROM programming method and device manufactured therebyUNITED MICROELECTRONICS CORP·Filed 1995·Granted Aug 5, 1997·4 cites·9 claims
- 5035US2002182834A1Method of manufacturing a transistor with a footed offset spacerFiled 2001·Application pending·0 cites
Showing the top 50 of 54 patent records by PatentIndex Score.
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