Inventor · disambiguated record
Ching-Hua Yeh
Also filed as: YEH CHING-HUA
12 granted patents·3 pending applications·60 citations·filing 1996–2025
87Inventor score
Files withUNITED MICROELECTRONICS CORP6SHENZHEN GOODIX TECH CO LTD3TAIWAN SEMICONDUCTOR MFG2DIALOG SEMICONDUCTOR BV1GOODIX TECH INC1
Top patents by PatentIndex Score
15 records- 0197US10950213B1Hybrid active noise cancellation filter adaptationGOODIX TECH INC·Filed 2020·Granted Mar 16, 2021·28 cites·18 claims
- 0294US11189261B1Hybrid active noise control systemSHENZHEN GOODIX TECH CO LTD·Filed 2020·Granted Nov 30, 2021·22 cites·20 claims
- 0372US10964689B2Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2017·Granted Mar 30, 2021·2 cites·17 claims
- 0468US2025266291A1Method for fabricating physically unclonable function deviceUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 0566US12322645B2Method for fabricating physically unclonable function deviceUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jun 3, 2025·0 cites·2 claims
- 0665US11205412B1Hybrid active noise cancellation filter adaptationSHENZHEN GOODIX TECH CO LTD·Filed 2021·Granted Dec 21, 2021·0 cites·20 claims
- 0761US12412848B2Physical unclonable function generator and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2022·Granted Sep 9, 2025·0 cites·20 claims
- 0861US11545484B2Method of dummy pattern layoutUNITED MICROELECTRONICS CORP·Filed 2021·Granted Jan 3, 2023·0 cites·7 claims
- 0957US2025192033A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1051US11790882B2Active noise cancellation filter adaptation with ear cavity frequency response compensationSHENZHEN GOODIX TECH CO LTD·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
- 1150US2009170200A1Stem cell mediumUNIV KAOHSIUNG MEDICAL·Filed 2008·Application pending·0 cites
- 1249US9314504B2Use of members of IL-10 cytokine familyUNIV TAIPEI MEDICAL·Filed 2013·Granted Apr 19, 2016·0 cites·3 claims
- 1348US12254896B1Audio signal detectorDIALOG SEMICONDUCTOR BV·Filed 2021·Granted Mar 18, 2025·0 cites·20 claims
- 1436US5701174ATemplate mask for assisting in optical inspection of oxidation induced stacking fault (OISF)TAIWAN SEMICONDUCTOR MFG·Filed 1996·Granted Dec 23, 1997·5 cites·10 claims
- 1532US5933229ATemplate mask for assisting in optical inspection of oxidation induced stacking fault (OISF)TAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Aug 3, 1999·3 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →