Inventor · disambiguated record
Geeng-Lih Lin
Also filed as: LIN GEENG-LIH
28 granted patents·3 pending applications·482 citations·filing 1999–2016
97Inventor score
Top patents by PatentIndex Score
31 records- 0194US9437591B1Cross-domain electrostatic discharge protection deviceVANGUARD INT SEMICONDUCT CORP·Filed 2015·Granted Sep 6, 2016·15 cites·16 claims
- 0292US6559508B1ESD protection device for open drain I/O pad in integrated circuits with merged layout structureVANGUARD INT SEMICONDUCT CORP·Filed 2000·Granted May 6, 2003·76 cites·18 claims
- 0392US6465848B2Low-voltage-triggered electrostatic discharge protection device and relevant circuitryVANGUARD INT SEMICONDUCT CORP·Filed 2001·Granted Oct 15, 2002·72 cites·9 claims
- 0488US10177135B2Integrated circuit and electrostatic discharge protection circuit thereofVANGUARD INT SEMICONDUCT CORP·Filed 2016·Granted Jan 8, 2019·6 cites·20 claims
- 0587US6665160B2Voltage control component for ESD protection and its relevant circuitryVANGUARD INT SEMICONDUCT CORP·Filed 2001·Granted Dec 16, 2003·44 cites·24 claims
- 0687US6621673B2Two-stage ESD protection circuit with a secondary ESD protection circuit having a quicker trigger-on rateVANGUARD INT SEMICONDUCT CORP·Filed 2001·Granted Sep 16, 2003·41 cites·15 claims
- 0782US9633992B1Electrostatic discharge protection deviceVANGUARD INT SEMICONDUCT CORP·Filed 2016·Granted Apr 25, 2017·4 cites·10 claims
- 0878US6392860B1Electrostatic discharge protection circuit with gate-modulated field-oxide deviceVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted May 21, 2002·40 cites·22 claims
- 0978US6218226B1Method of forming an ESD protection deviceVANGUARD INT SEMICONDUCT CORP·Filed 2000·Granted Apr 17, 2001·33 cites·2 claims
- 1077US6590264B2Hybrid diodes with excellent ESD protection capacityVANGUARD INT SEMICONDUCT CORP·Filed 2002·Granted Jul 8, 2003·22 cites·19 claims
- 1176US8921202B2Semiconductor device and fabrication method thereofLIN GEENG-LIH·Filed 2011·Granted Dec 30, 2014·5 cites·10 claims
- 1276US6526545B1Method for generating wafer testing programVANGUARD INT SEMICONDUCT CORP·Filed 2000·Granted Feb 25, 2003·26 cites·17 claims
- 1375US6316805B1Electrostatic discharge device with gate-controlled field oxide transistorVANGUARD INT SEMICONDUCT CORP·Filed 2000·Granted Nov 13, 2001·20 cites·8 claims
- 1471US6046087AFabrication of ESD protection device using a gate as a silicide blocking mask for a drain regionVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Apr 4, 2000·30 cites·6 claims
- 1570US7579658B2Devices without current crowding effect at the finger's endsVANGUARD INT SEMICONDUCT CORP·Filed 2007·Granted Aug 25, 2009·4 cites·8 claims
- 1668US9893516B2ESD protection circuitsVANGUARD INT SEMICONDUCT CORP·Filed 2015·Granted Feb 13, 2018·1 cites·13 claims
- 1767US7599160B2Electrostatic discharge protection circuitsVANGUARD INT SEMICONDUCT CORP·Filed 2007·Granted Oct 6, 2009·3 cites·20 claims
- 1859US7098522B2High voltage device with ESD protectionVANGUARD INT SEMICONDUCT CORP·Filed 2004·Granted Aug 29, 2006·8 cites·10 claims
- 1959US6274911B1CMOS device with deep current path for ESD protectionVANGUARD INT SEMICONDUCT CORP·Filed 2000·Granted Aug 14, 2001·7 cites·5 claims
- 2058US6355960B1ESD protection for open drain I/O pad in integrated circuit with parasitic field FET devicesVANGUARD INT SEMICONDUCT CORP·Filed 2000·Granted Mar 12, 2002·8 cites·18 claims
- 2156US9443943B2Semiconductor device and fabrication method thereofVANGUARD INT SEMICONDUCT CORP·Filed 2014·Granted Sep 13, 2016·0 cites·12 claims
- 2255US7129546B2Electrostatic discharge protection deviceVANGUARD INT SEMICONDUCT CORP·Filed 2004·Granted Oct 31, 2006·6 cites·30 claims
- 2347US7755143B2Semiconductor deviceVANGUARD INT SEMICONDUCT CORP·Filed 2008·Granted Jul 13, 2010·0 cites·24 claims
- 2442US6420774B1Low junction capacitance semiconductor structure and I/O bufferVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Jul 16, 2002·7 cites·8 claims
- 2537US8125028B2Semiconductor devices for high power applicationTSAI HUNG-SHERN·Filed 2008·Granted Feb 28, 2012·0 cites·7 claims
- 2637US6169001B1CMOS device with deep current path for ESD protectionVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Jan 2, 2001·4 cites·6 claims
- 2737US2005179087A1LDMOS transistor with improved ESD protectionFiled 2004·Application pending·0 cites
- 2835US10644501B2Driving circuitVANGUARD INT SEMICONDUCT CORP·Filed 2016·Granted May 5, 2020·0 cites·4 claims
- 2935US9722097B2Semiconductor device and method for manufacturing the sameVANGUARD INT SEMICONDUCT CORP·Filed 2015·Granted Aug 1, 2017·0 cites·20 claims
- 3035US2004052020A1Devices without current crowding effect at the finger's endsFiled 2003·Application pending·0 cites
- 3134US2001010954A1Method of forming an ESD protection deviceFiled 2001·Application pending·0 cites
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