Inventor · disambiguated record
Thomas A. O'Dell
Also filed as: O'DELL THOMAS · O'DELL THOMAS A · O'DELL THOMAS ANTHONY
24 granted patents·3 pending applications·1,281 citations·filing 1995–2020
97Inventor score
Top patents by PatentIndex Score
27 records- 0198US7425719B2Method and apparatus for selectively providing data from a test head to a processorWD MEDIA INC·Filed 2005·Granted Sep 16, 2008·74 cites·44 claims
- 0298US7375362B2Method and apparatus for reducing or eliminating stray light in an optical test headWD MEDIA INC·Filed 2005·Granted May 20, 2008·73 cites·31 claims
- 0398US7302148B2Test head for optically inspecting workpiecesKOMAG INC·Filed 2005·Granted Nov 27, 2007·69 cites·36 claims
- 0498US7292329B2Test head for optically inspecting workpieces comprising a lens for elongating a laser spot on the workpiecesKOMAG INC·Filed 2005·Granted Nov 6, 2007·69 cites·18 claims
- 0598US7184139B2Test head for optically inspecting workpiecesKOMAG INC·Filed 2005·Granted Feb 27, 2007·76 cites·21 claims
- 0698US7119990B2Storage device including a center tapped write transducerKOMAG INC·Filed 2003·Granted Oct 10, 2006·130 cites·8 claims
- 0797US7944165B1Inspection system with dual encodersWD MEDIA INC·Filed 2008·Granted May 17, 2011·73 cites·12 claims
- 0897US7239970B2Robotic system for optically inspecting workpiecesKOMAG INC·Filed 2005·Granted Jul 3, 2007·69 cites·27 claims
- 0996US8797667B1Disk drive calibrating bias signal for touchdown sensorWESTERN DIGITAL TECH INC·Filed 2012·Granted Aug 5, 2014·52 cites·18 claims
- 1096US6548821B1Method and apparatus for inspecting substratesKOMAG INC·Filed 2000·Granted Apr 15, 2003·101 cites·21 claims
- 1195US8331056B2Spin stand comprising a dual disk clampO'DELL THOMAS A·Filed 2010·Granted Dec 11, 2012·70 cites·10 claims
- 1295US6068891AMethod for laser texturing a glass ceramic substrate and the resulting substrateKOMAG INC·Filed 1997·Granted May 30, 2000·110 cites·13 claims
- 1394US8427770B1Discriminating between protrusion defects and recess defects on a disk recording mediumO'DELL THOMAS A·Filed 2011·Granted Apr 23, 2013·70 cites·14 claims
- 1491US8218260B2Processing disks on a spin standIAMRATANAKUL DHANAKORN·Filed 2010·Granted Jul 10, 2012·71 cites·8 claims
- 1588US6566674B1Method and apparatus for inspecting substratesKOMAG INC·Filed 1999·Granted May 20, 2003·87 cites·30 claims
- 1687US5948288ALaser disk texturing apparatusKOMAG INC·Filed 1996·Granted Sep 7, 1999·52 cites·18 claims
- 1783US9273985B2Apparatus for automated positioning of eddy current test probeBWXT NUCLEAR ENERGY INC·Filed 2013·Granted Mar 1, 2016·4 cites·5 claims
- 1877US8929008B1Systems and methods for testing magnetic media disks during manufacturing using sliders with temperature sensorsWD MEDIA LLC·Filed 2013·Granted Jan 6, 2015·4 cites·28 claims
- 1966US11758857B2System and method for fluid flow measurement and controlHOT SOCKET LLC·Filed 2020·Granted Sep 19, 2023·0 cites·16 claims
- 2062US8902533B1Disk drive detecting different asperities on a disk using different sensor bias settingsWESTERN DIGITAL TECH INC·Filed 2013·Granted Dec 2, 2014·1 cites·24 claims
- 2160US5595768ALaser disk texturing apparatusKOMAG INC·Filed 1995·Granted Jan 21, 1997·26 cites·4 claims
- 2258US10736280B2System and method for fluid flow measurement and controlHOT SOCKET LLC·Filed 2018·Granted Aug 11, 2020·0 cites·20 claims
- 2358US2016176685A1Apparatus for automated positioning of eddy current test probeBWXT NUCLEAR ENERGY INC·Filed 2016·Application pending·0 cites
- 2444US2006181697A1Circularly polarized light for optically inspecting workpiecesKOMAG INC·Filed 2005·Application pending·0 cites
- 2543US8746089B2Apparatus for automated positioning of eddy current test probeO'DELL THOMAS·Filed 2010·Granted Jun 10, 2014·0 cites·8 claims
- 2640US10955861B2Electronic circuit for fluid flow measurement and controlHOT SOCKET LLC·Filed 2018·Granted Mar 23, 2021·0 cites·17 claims
- 2729US2001008715A1Continuous texture features for a disk substrateFiled 1998·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →