Inventor · disambiguated record
Ian Shay
Also filed as: SHAY IAN · SHAY IAN C
16 granted patents·9 pending applications·523 citations·filing 2001–2015
95Inventor score
Top patents by PatentIndex Score
25 records- 0197US6784662B2Eddy current sensor arrays having drive windings with extended portionsJENTEK SENSORS INC·Filed 2002·Granted Aug 31, 2004·94 cites·49 claims
- 0295US6995557B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2004·Granted Feb 7, 2006·64 cites·25 claims
- 0395US6727691B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2002·Granted Apr 27, 2004·67 cites·44 claims
- 0494US7451657B2Material condition monitoring with multiple sensing modesJENTEK SENSORS INC·Filed 2005·Granted Nov 18, 2008·29 cites·21 claims
- 0594US6992482B2Magnetic field sensor having a switchable drive current spatial distributionJENTEK SENSORS INC·Filed 2001·Granted Jan 31, 2006·44 cites·20 claims
- 0693US8237433B2Magnetic field characterization of stresses and properties in materialsGOLDFINE NEIL J·Filed 2011·Granted Aug 7, 2012·9 cites·35 claims
- 0789US7876094B2Magnetic field characterization of stresses and properties in materialsJENTEK SENSORS INC·Filed 2008·Granted Jan 25, 2011·9 cites·18 claims
- 0889US7049811B2Test circuit having parallel drive segments and a plurality of sense elementsJENTEK SENSORS INC·Filed 2004·Granted May 23, 2006·28 cites·28 claims
- 0987US7696748B2Absolute property measurements using electromagnetic sensorsJENTEK SENSORS INC·Filed 2004·Granted Apr 13, 2010·31 cites·18 claims
- 1084US7188532B2Self-monitoring metals, alloys and materialsJENTEK SENSORS INC·Filed 2004·Granted Mar 13, 2007·20 cites·13 claims
- 1182US7183764B2Method for inspecting a channel using a flexible sensorJENTEK SENSORS INC·Filed 2003·Granted Feb 27, 2007·20 cites·14 claims
- 1280US7161351B2Hidden feature characterization using a database of sensor responsesJENTEK SENSORS INC·Filed 2004·Granted Jan 9, 2007·16 cites·29 claims
- 1380US6781387B2Inspection method using penetrant and dielectrometerJENTEK SENSORS INC·Filed 2002·Granted Aug 24, 2004·44 cites·4 claims
- 1477US7526964B2Applied and residual stress measurements using magnetic field sensorsJENTEK SENSORS INC·Filed 2003·Granted May 5, 2009·19 cites·23 claims
- 1569US7411390B2High resolution inductive sensor arrays for UXOJENTEK SENSORS INC·Filed 2003·Granted Aug 12, 2008·25 cites·23 claims
- 1663US8981018B2Internal material condition monitoring for controlGOLDFINE NEIL J·Filed 2005·Granted Mar 17, 2015·4 cites·22 claims
- 1754US2006186880A1Automated drawing tool and method for drawing a sensor layoutSCHLICKER DARRELL E·Filed 2006·Application pending·0 cites
- 1854US2007114993A1Magnetic field characterization of stresses and properties in materialsGOLDFINE NEIL J·Filed 2005·Application pending·0 cites
- 1953US2007227255A1Self-monitoring metals, alloys and materialsGOLDFINE NEIL J·Filed 2007·Application pending·0 cites
- 2052US2004056654A1Magnetic field characterization of stresses and properties in materialsJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 2151US2005007106A1Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 2249US2015160144A1Internal material condition monitoring for controlJENTEK SENSORS INC·Filed 2015·Application pending·0 cites
- 2345US2004004475A1High throughput absolute flaw imagingJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 2445US2003164700A1High resolution hidden damage imagingJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 2543US2006076952A9Segmented field sensorsJENTEK SENSORS INC·Filed 2005·Application pending·0 cites
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