Inventor · disambiguated record
Wei-Pin Changchien
Also filed as: CHANGCHIEN WEI-PIN
20 granted patents·4 pending applications·53 citations·filing 2009–2025
92Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD10TAIWAN SEMICONDUCTOR MFG8TSENG NAN-HSIN2CHEN YI-WEI1CHUANG YI-LIN1
Top patents by PatentIndex Score
24 records- 0196US10678973B2Machine-learning design enablement platformTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jun 9, 2020·13 cites·20 claims
- 0289US11017149B2Machine-learning design enablement platformTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 25, 2021·2 cites·20 claims
- 0386US8113412B1Methods for detecting defect connections between metal bumpsTSENG NAN-HSIN·Filed 2011·Granted Feb 14, 2012·7 cites·20 claims
- 0483US9269640B2Repairing monolithic stacked integrated circuits with a redundant layer and lithography processTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Feb 23, 2016·5 cites·16 claims
- 0583US8701070B2Group bounding box region-constrained placement for integrated circuit designCHUANG YI-LIN·Filed 2012·Granted Apr 15, 2014·9 cites·20 claims
- 0680US9097762B2Method and apparatus for diagnosing an integrated circuitTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Aug 4, 2015·4 cites·20 claims
- 0775US10267853B2System and method to diagnose integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 23, 2019·2 cites·20 claims
- 0875US2025336762A1Integrated circuit device with thermoelectric coolingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0972US8384430B2RC delay detectors with high sensitivity for through substrate viasTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Feb 26, 2013·4 cites·24 claims
- 1071US8937512B1Voltage-controlled oscillatorTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jan 20, 2015·3 cites·20 claims
- 1171US2025140642A1Integrated circuit device with thermoelectric coolingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1266US8981842B1Integrated circuit comprising buffer chainTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Mar 17, 2015·1 cites·20 claims
- 1364US10866281B2System and method to diagnose integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 15, 2020·0 cites·20 claims
- 1463US8566766B2Method for detecting small delay defectsGOEL SANDEEP KUMAR·Filed 2010·Granted Oct 22, 2013·1 cites·21 claims
- 1554US8258883B2System and method for characterizing process variationsCHEN YI-WEI·Filed 2009·Granted Sep 4, 2012·2 cites·24 claims
- 1654US2024063074A1Semiconductor packages and methods of manufacturing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
- 1752US9601478B2Oxide definition (OD) gradient reduced semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 21, 2017·0 cites·20 claims
- 1852US9286431B2Oxide definition (OD) gradient reduced semiconductor device and method of makingTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Mar 15, 2016·0 cites·20 claims
- 1951US9478469B2Integrated circuit comprising buffer chainTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 25, 2016·0 cites·20 claims
- 2049US9847318B2Monolithic stacked integrated circuits with a redundant layer for repairing defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 19, 2017·0 cites·20 claims
- 2147US8347132B2System and method for reducing processor power consumptionTAIWAN SEMICONDUCTOR MFG·Filed 2009·Granted Jan 1, 2013·0 cites·20 claims
- 2240US9310431B2Diagnosis framework to shorten yield learning cycles of advanced processesLIU YEN-LING·Filed 2012·Granted Apr 12, 2016·0 cites·20 claims
- 2338US2016091563A1Scan flip-flopTAIWAN SEMICONDUCTOR MFG·Filed 2014·Application pending·0 cites
- 2436US8339155B2System and method for detecting soft-failsTSENG NAN-HSIN·Filed 2010·Granted Dec 25, 2012·0 cites·20 claims
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