Inventor · disambiguated record

Simon Yalov

Also filed as: YALOV SIMON

3 granted patents·20 citations·filing 2002–2006

67Inventor score

Technology areasG01N

Files withAPPLIED MATERIALS ISRAEL LTD3

Top patents by PatentIndex Score

3 records

0185US7187439B2High throughput inspection system and method for generating transmitted and/or reflected imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Mar 6, 2007·11 cites·18 claims
0272US6930770B2High throughput inspection system and method for generating transmitted and/or reflected imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted Aug 16, 2005·9 cites·17 claims
0353US7518718B2High throughput inspection system and a method for generating transmitted and/or reflected imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Apr 14, 2009·0 cites·12 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →