Inventor · disambiguated record
John T. Yue
Also filed as: YUE JOHN T
9 granted patents·319 citations·filing 1993–2007
91Inventor score
Top patents by PatentIndex Score
9 records- 0185US5600578ATest method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test resultsADVANCED MICRO DEVICES INC·Filed 1993·Granted Feb 4, 1997·103 cites·38 claims
- 0284US5606518ATest method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test resultsADVANCED MICRO DEVICES INC·Filed 1995·Granted Feb 25, 1997·56 cites·19 claims
- 0379US5932911ABar field effect transistorADVANCED MICRO DEVICES INC·Filed 1996·Granted Aug 3, 1999·50 cites·10 claims
- 0478US8000520B2Apparatus and method for testing image sensor wafers to identify pixel defectsOMNIVISION TECH INC·Filed 2007·Granted Aug 16, 2011·5 cites·25 claims
- 0575US5923063ADouble density V nonvolatile memory cellADVANCED MICRO DEVICES INC·Filed 1998·Granted Jul 13, 1999·38 cites·26 claims
- 0664US5504017AVoid detection in metallization patternsADVANCED MICRO DEVICES INC·Filed 1994·Granted Apr 2, 1996·25 cites·33 claims
- 0757US5786705AMethod for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systemsADVANCED MICRO DEVICES INC·Filed 1996·Granted Jul 28, 1998·18 cites·11 claims
- 0851US6180441B1Bar field effect transistorADVANCED MICRO DEVICES INC·Filed 1999·Granted Jan 30, 2001·14 cites·16 claims
- 0947US5612627AMethod for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systemsADVANCED MICRO DEVICES INC·Filed 1994·Granted Mar 18, 1997·10 cites·36 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →