Inventor · disambiguated record
Nguyen Duc Bui
Also filed as: BUI NGUYEN D · BUI NGUYEN DUC
21 granted patents·586 citations·filing 1994–2019
96Inventor score
Top patents by PatentIndex Score
21 records- 0194US6163049AMethod of forming a composite interpoly gate dielectricADVANCED MICRO DEVICES INC·Filed 1998·Granted Dec 19, 2000·121 cites·5 claims
- 0289US6472233B1MOSFET test structure for capacitance-voltage measurementsADVANCED MICRO DEVICES INC·Filed 2000·Granted Oct 29, 2002·45 cites·12 claims
- 0386US10217521B2Multi-time programmable non-volatile memory cellLATTICE SEMICONDUCTOR CORP·Filed 2017·Granted Feb 26, 2019·4 cites·22 claims
- 0486US6320391B1Interconnection device for low and high current stress electromigration and correlation studyADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 20, 2001·65 cites·15 claims
- 0584US5712510AReduced electromigration interconnection lineADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 27, 1998·78 cites·5 claims
- 0677US11295825B2Multi-time programmable non-volatile memory cellLATTICE SEMICONDUCTOR CORP·Filed 2019·Granted Apr 5, 2022·2 cites·19 claims
- 0774US5689139AEnhanced electromigration lifetime of metal interconnection linesADVANCED MICRO DEVICES INC·Filed 1995·Granted Nov 18, 1997·48 cites·8 claims
- 0873US6700154B1EEPROM cell with trench coupling capacitorLATTICE SEMICONDUCTOR CORP·Filed 2002·Granted Mar 2, 2004·24 cites·18 claims
- 0972US6329831B1Method and apparatus for reliability testing of integrated circuit structures and devicesADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 11, 2001·42 cites·21 claims
- 1068US6413820B2Method of forming a composite interpoly gate dielectricADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 2, 2002·12 cites·2 claims
- 1166US5650651APlasma damage reduction device for sub-half micron technologyADVANCED MICRO DEVICES INC·Filed 1996·Granted Jul 22, 1997·32 cites·5 claims
- 1257US5786705AMethod for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systemsADVANCED MICRO DEVICES INC·Filed 1996·Granted Jul 28, 1998·18 cites·11 claims
- 1356US5726458AHot carrier injection test structure and technique for statistical evaluationADVANCED MICRO DEVICES INC·Filed 1997·Granted Mar 10, 1998·18 cites·9 claims
- 1456US5598009AHot carrier injection test structure and testing technique for statistical evaluationADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 28, 1997·18 cites·1 claims
- 1547US5612627AMethod for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systemsADVANCED MICRO DEVICES INC·Filed 1994·Granted Mar 18, 1997·10 cites·36 claims
- 1646US5966024ASensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principleADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 12, 1999·16 cites·4 claims
- 1745US6063662AMethods for forming a control gate apparatus in non-volatile memory semiconductor devicesADVANCED MICRO DEVICES INC·Filed 1997·Granted May 16, 2000·8 cites·11 claims
- 1841US6100101ASensitive technique for metal-void detectionADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 8, 2000·9 cites·18 claims
- 1939US5808361AIntergrated circuit interconnect via structure having low resistanceADVANCED MICRO DEVICES INC·Filed 1997·Granted Sep 15, 1998·8 cites·8 claims
- 2037US6703305B1Semiconductor device having metallized interconnect structure and method of fabricationLATTICE SEMICONDUCTOR CORP·Filed 2002·Granted Mar 9, 2004·0 cites·11 claims
- 2137US6005409ADetection of process-induced damage on transistors in real timeADVANCED MICRO DEVICES INC·Filed 1996·Granted Dec 21, 1999·8 cites·10 claims
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