Inventor · disambiguated record
Yanko K. Sheiretov
Also filed as: SHEIRETOV YANKO · SHEIRETOV YANKO K · SHEIRETOV YANKO KONSTANTINOV
28 granted patents·3 pending applications·205 citations·filing 2000–2023
96Inventor score
Files withJENTEK SENSORS INC21GOLDFINE NEIL J5AFFERA INC2SHEIRETOV YANKO K2SHEIRETOV YANKO KONSTANTINOV1
Top patents by PatentIndex Score
31 records- 0195US7528598B2Fastener and fitting based sensing methodsJENTEK SENSORS INC·Filed 2006·Granted May 5, 2009·27 cites·33 claims
- 0293US7467057B2Material property estimation using non-orthogonal responsive databasesJENTEK SENSORS INC·Filed 2005·Granted Dec 16, 2008·16 cites·14 claims
- 0391US9255875B2Method and apparatus for inspection of corrosion and other defects through insulationJENTEK SENSORS INC·Filed 2012·Granted Feb 9, 2016·12 cites·20 claims
- 0487US7289913B2Local feature characterization using quasistatic electromagnetic sensorsJENTEK SENSORS INC·Filed 2005·Granted Oct 30, 2007·11 cites·14 claims
- 0586US8494810B2Component adaptive life managementGOLDFINE NEIL J·Filed 2010·Granted Jul 23, 2013·20 cites·23 claims
- 0686US8050883B2Material property estimation using inverse interpolationJENTEK SENSORS INC·Filed 2008·Granted Nov 1, 2011·9 cites·15 claims
- 0785US7280940B2Segmented field dielectric sensor array for material characterizationJENTEK SENSORS INC·Filed 2006·Granted Oct 9, 2007·9 cites·28 claims
- 0885US6486673B1Segmented field dielectrometerJENTEK SENSORS INC·Filed 2000·Granted Nov 26, 2002·57 cites·19 claims
- 0983US10324062B2Method and apparatus for measurement of material conditionJENTEK SENSORS INC·Filed 2014·Granted Jun 18, 2019·4 cites·4 claims
- 1082US10732096B2Method and apparatus for inspection of corrosion and other defects through insulationJENTEK SENSORS INC·Filed 2017·Granted Aug 4, 2020·2 cites·20 claims
- 1179US12359945B2Measurement system and method of useJENTEK SENSORS INC·Filed 2023·Granted Jul 15, 2025·0 cites·20 claims
- 1278US11490958B2Devices, systems and methods for balancing ablation energyAFFERA INC·Filed 2018·Granted Nov 8, 2022·3 cites·26 claims
- 1376US11841245B2Measurement system and method of useJENTEK SENSORS INC·Filed 2023·Granted Dec 12, 2023·0 cites·18 claims
- 1475US10001457B2Performance curve generation for non-destructive testing sensorsGOLDFINE NEIL J·Filed 2012·Granted Jun 19, 2018·4 cites·14 claims
- 1573US11959880B2Method and apparatus for measurement of material conditionJENTEK SENSORS INC·Filed 2021·Granted Apr 16, 2024·0 cites·16 claims
- 1673US8222897B2Test circuit with sense elements having associated and unassociated primary windingsSHEIRETOV YANKO K·Filed 2008·Granted Jul 17, 2012·8 cites·20 claims
- 1771US10677756B2Integrated sensor cartridge system and method of useJENTEK SENSORS INC·Filed 2016·Granted Jun 9, 2020·1 cites·19 claims
- 1871US9823179B2Method and apparatus for inspection of corrosion and other defects through insulationJENTEK SENSORS INC·Filed 2016·Granted Nov 21, 2017·1 cites·9 claims
- 1971US7812601B2Material condition assessment with eddy current sensorsJENTEK SENSORS INC·Filed 2009·Granted Oct 12, 2010·2 cites·18 claims
- 2069US12161399B2Devices, systems, and methods for balancing ablation energyAFFERA INC·Filed 2022·Granted Dec 10, 2024·0 cites·23 claims
- 2168US8768657B2Remaining life prediction for individual components from sparse dataGOLDFINE NEIL J·Filed 2007·Granted Jul 1, 2014·8 cites·27 claims
- 2267US11549831B2Measurement system and method of useJENTEK SENSORS INC·Filed 2019·Granted Jan 10, 2023·0 cites·18 claims
- 2366US11092571B2Method and apparatus for measurement of material conditionJENTEK SENSORS INC·Filed 2019·Granted Aug 17, 2021·0 cites·20 claims
- 2461USD830863SPortable test instrumentJENTEK SENSORS INC·Filed 2017·Granted Oct 16, 2018·7 cites·1 claims
- 2561US8415947B2Method for stress assessment that removes temperature effects and hysteresis on the material property measurementsSHEIRETOV YANKO K·Filed 2012·Granted Apr 9, 2013·2 cites·9 claims
- 2658US2012013334A1Material Property Estimation Using Inverse InterpolationSHEIRETOV YANKO KONSTANTINOV·Filed 2011·Application pending·0 cites
- 2754US10416118B1Measurement system and method of useJENTEK SENSORS INC·Filed 2017·Granted Sep 17, 2019·0 cites·9 claims
- 2852US2006244443A1Material condition assessment with eddy current sensorsGOLDFINE NEIL J·Filed 2006·Application pending·0 cites
- 2944US2007069720A1Material characterization with model based sensorsGOLDFINE NEIL J·Filed 2005·Application pending·0 cites
- 3041USD857534SPortable test instrumentJENTEK SENSORS INC·Filed 2018·Granted Aug 27, 2019·2 cites·1 claims
- 3137US7533575B2Quasistatic magnetic and electric field stress/strain gagesJENTEK SENSORS INC·Filed 2007·Granted May 19, 2009·0 cites·20 claims
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