Inventor · disambiguated record
Takeshi Umemoto
Also filed as: UMEMOTO TAKESHI
29 granted patents·2 pending applications·463 citations·filing 1974–2021
96Inventor score
Top patents by PatentIndex Score
31 records- 0193US6104086ASemiconductor device having lead terminals bent in J-shapeNEC CORP·Filed 1998·Granted Aug 15, 2000·167 cites·6 claims
- 0292USD774957SAll-terrain vehicleYAMAHA MOTOR CO LTD·Filed 2015·Granted Dec 27, 2016·44 cites·1 claims
- 0391USD761698SFour wheeled vehicleYAMAHA MOTOR CO LTD·Filed 2015·Granted Jul 19, 2016·41 cites·1 claims
- 0483USD984319SMotorcycleYAMAHA MOTOR CO LTD·Filed 2021·Granted Apr 25, 2023·8 cites·1 claims
- 0577US7770474B2Sample operation apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Aug 10, 2010·6 cites·6 claims
- 0669US8028567B2AFM tweezers, method for producing AFM tweezers, and scanning probe microscopeAOI ELECTRONICS CO LTD·Filed 2008·Granted Oct 4, 2011·4 cites·11 claims
- 0769US3948775AHorizontal packed column consisting of multiple chambers with fluid distributorsTORAY INDUSTRIES·Filed 1974·Granted Apr 6, 1976·24 cites·3 claims
- 0867US7873432B2Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysisSHARP KK·Filed 2006·Granted Jan 18, 2011·2 cites·21 claims
- 0964US5939623AScanning type near field interatomic force microscopeSEIKO INSTR INC·Filed 1996·Granted Aug 17, 1999·42 cites·22 claims
- 1063US6242797B1Semiconductor device having pellet mounted on radiating plate thereofNEC CORP·Filed 1998·Granted Jun 5, 2001·31 cites·10 claims
- 1160USD805000SFour wheeled vehicleYAMAHA MOTOR CO LTD·Filed 2016·Granted Dec 12, 2017·8 cites·1 claims
- 1259US7866205B2Sample operation apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Jan 11, 2011·2 cites·6 claims
- 1358US6337270B2Process for manufacturing semiconductor deviceSHARP KK·Filed 2001·Granted Jan 8, 2002·6 cites·12 claims
- 1458US2014283900A1Solar cell module having laminated glass structureSHARP KK·Filed 2012·Application pending·0 cites
- 1557US12405585B2Air conditioning system including a platform with remote access to a main body of an air conditioning apparatus and including multiple function layersFUJITSU GENERAL LTD·Filed 2021·Granted Sep 2, 2025·0 cites·8 claims
- 1656US9015444B2Access apparatus and available storage space calculation methodMAEDA TAKUJI·Filed 2009·Granted Apr 21, 2015·1 cites·1 claims
- 1756US7926328B2Sample manipulating apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Apr 19, 2011·2 cites·12 claims
- 1855US7515258B2Semiconductor device, and method and apparatus for inspecting appearance thereofSHARP KK·Filed 2006·Granted Apr 7, 2009·1 cites·21 claims
- 1951US11598737B2Analyzing apparatus and analyzing methodHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Mar 7, 2023·0 cites·8 claims
- 2049US6175150B1Plastic-encapsulated semiconductor device and fabrication method thereofNEC CORP·Filed 1998·Granted Jan 16, 2001·18 cites·13 claims
- 2148US6848454B2Method of manufacturing semiconductor deviceSHARP KK·Filed 2001·Granted Feb 1, 2005·3 cites·15 claims
- 2248US6765283B2Semiconductor device with multi-layer interlayer dielectric filmSHARP KK·Filed 2002·Granted Jul 20, 2004·3 cites·15 claims
- 2346US6319753B1Semiconductor device having lead terminals bent in J-shapeNEC CORP·Filed 1999·Granted Nov 20, 2001·12 cites·3 claims
- 2446US6150715ASemiconductor device with radiation plate for high radiation character and method of manufacturing the sameNEC CORP·Filed 1998·Granted Nov 21, 2000·14 cites·6 claims
- 2546US2011083007A1Recording device and method for activating the sameMORI TSUTOMU·Filed 2009·Application pending·0 cites
- 2645US6291822B1Scanning probe microscopeSEIKO INSTR INC·Filed 1998·Granted Sep 18, 2001·11 cites·7 claims
- 2739US7874016B2Scanning probe microscope and scanning methodSII NANOTECHNOLOGY INC·Filed 2007·Granted Jan 18, 2011·0 cites·9 claims
- 2837US9572082B2Method for digital communication, radio communication system, and radio communication apparatusFUJITSU LTD·Filed 2015·Granted Feb 14, 2017·0 cites·30 claims
- 2937US6165818AMethod of manufacturing a semiconductor device with a pair of radiating terminals and a plurality of lead terminals formed from a single lead frameNEC CORP·Filed 1998·Granted Dec 26, 2000·7 cites·4 claims
- 3032US6242736B1Scanning probe microscopeSEIKO INSTR INC·Filed 1998·Granted Jun 5, 2001·3 cites·31 claims
- 3132US6177720B1Method of manufacturing a semiconductor device with a pair of radiating terminals and a plurality of lead terminals formed from a single lead frameNEC CORP·Filed 1999·Granted Jan 23, 2001·3 cites·2 claims
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