Inventor · disambiguated record
Nobuyuki Ohminami
Also filed as: OHMINAMI NOBUYUKI
4 granted patents·11 citations·filing 2001–2006
68Inventor score
Files withSHARP KK4
Top patents by PatentIndex Score
4 records- 0167US7873432B2Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysisSHARP KK·Filed 2006·Granted Jan 18, 2011·2 cites·21 claims
- 0255US7515258B2Semiconductor device, and method and apparatus for inspecting appearance thereofSHARP KK·Filed 2006·Granted Apr 7, 2009·1 cites·21 claims
- 0350US7278587B2Thermal treatment apparatus and thermal treatment methodSHARP KK·Filed 2002·Granted Oct 9, 2007·5 cites·16 claims
- 0445US6975102B2Apparatus and method for analyzing capacitance of insulatorSHARP KK·Filed 2001·Granted Dec 13, 2005·3 cites·2 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →