Inventor · disambiguated record
Jeffrey O'Dell
Also filed as: O'DELL JEFFREY · O'DELL JEFFREY L · O'DELL JEFFREY LEE
6 granted patents·3 pending applications·509 citations·filing 1999–2020
88Inventor score
Top patents by PatentIndex Score
9 records- 0197US6324298B1Automated wafer defect inspection system and a process of performing such inspectionAUGUST TECHNOLOGY CORP·Filed 1999·Granted Nov 27, 2001·310 cites·26 claims
- 0294US6937753B1Automated wafer defect inspection system and a process of performing such inspectionAUGUST TECHNOLOGY CORP·Filed 2000·Granted Aug 30, 2005·96 cites·7 claims
- 0393US6826298B1Automated wafer defect inspection system and a process of performing such inspectionAUGUST TECHNOLOGY CORP·Filed 2000·Granted Nov 30, 2004·53 cites·5 claims
- 0492US9464992B2Automated wafer defect inspection system and a process of performing such inspectionRUDOLPH TECH INC·Filed 2016·Granted Oct 11, 2016·6 cites·11 claims
- 0592US7729528B2Automated wafer defect inspection system and a process of performing such inspectionRUDOLPH TECHNOLOGIES INC·Filed 2004·Granted Jun 1, 2010·43 cites·53 claims
- 0664US9337071B2Automated wafer defect inspection system and a process of performing such inspectionO'DELL JEFFREY L·Filed 2010·Granted May 10, 2016·1 cites·44 claims
- 0753US2012087569A1Automated wafer defect inspection system and a process of performing such inspectionO'DELL JEFFREY·Filed 2011·Application pending·0 cites
- 0845US2022199249A1System and method to self-determine a mental and emotional (non-physical) wellness score over time using deep learning algorithms (based on cognitive bias) which respond to various activities and events through a series of sensors, feedback, activities and conversational methods.ODELL JEFFREY·Filed 2020·Application pending·0 cites
- 0936US2009319512A1Aggregator, filter, and delivery system for online contentBAKER DOUGLAS·Filed 2009·Application pending·0 cites
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