Inventor · disambiguated record
Yoshiro Riho
Also filed as: RIHO YOSHIRO
48 granted patents·9 pending applications·773 citations·filing 1999–2025
98Inventor score
Files withELPIDA MEMORY INC22MICRON TECHNOLOGY INC13RIHO YOSHIRO10PS4 LUXCO SARL5LODESTAR LICENSING GROUP LLC3
Top patents by PatentIndex Score
57 records- 0198US7796453B2Semiconductor deviceELPIDA MEMORY INC·Filed 2008·Granted Sep 14, 2010·410 cites·17 claims
- 0296US10020045B2Partial access mode for dynamic random access memoryMICRON TECHNOLOGY INC·Filed 2014·Granted Jul 10, 2018·28 cites·9 claims
- 0396US7167403B2Semiconductor storage device and refresh control method thereforELPIDA MEMORY INC·Filed 2005·Granted Jan 23, 2007·45 cites·18 claims
- 0495US8243486B2Semiconductor deviceRIHO YOSHIRO·Filed 2010·Granted Aug 14, 2012·16 cites·21 claims
- 0593US8310855B2Semiconductor deviceRIHO YOSHIRO·Filed 2010·Granted Nov 13, 2012·15 cites·27 claims
- 0693US7158433B2Semiconductor storage device and method of controlling refreshing of semiconductor storage deviceELPIDA MEMORY INC·Filed 2005·Granted Jan 2, 2007·33 cites·14 claims
- 0792US8483986B2Semiconductor device, system with semiconductor device, and calibration methodRIHO YOSHIRO·Filed 2010·Granted Jul 9, 2013·17 cites·18 claims
- 0892US7346829B2Semiconductor device and testing method for sameELPIDA MEMORY INC·Filed 2005·Granted Mar 18, 2008·24 cites·5 claims
- 0992US2025383802A1Memory devices with multiple sets of latencies and methods for operating the sameLODESTAR LICENSING GROUP LLC·Filed 2025·Application pending·0 cites
- 1091US8749267B2DeviceELPIDA MEMORY INC·Filed 2012·Granted Jun 10, 2014·9 cites·15 claims
- 1191US7248528B2Refresh control method of a semiconductor memory device and semiconductor memory deviceELPIDA MEMORY INC·Filed 2005·Granted Jul 24, 2007·25 cites·28 claims
- 1287US7260011B2Semiconductor storage device and refresh control method thereforELPIDA MEMORY INC·Filed 2006·Granted Aug 21, 2007·14 cites·38 claims
- 1386US8599596B2Semiconductor deviceELPIDA MEMORY INC·Filed 2012·Granted Dec 3, 2013·6 cites·32 claims
- 1485US8788738B2Semiconductor device and method of manufacturing the sameRIHO YOSHIRO·Filed 2011·Granted Jul 22, 2014·6 cites·10 claims
- 1584US12423010B2Memory devices with multiple sets of latencies and methods for operating the sameLODESTAR LICENSING GROUP LLC·Filed 2024·Granted Sep 23, 2025·0 cites·20 claims
- 1684US8760901B2Semiconductor device having a control chip stacked with a controlled chipELPIDA MEMORY INC·Filed 2012·Granted Jun 24, 2014·6 cites·9 claims
- 1782US11727967B2Apparatuses and methods including dice latches in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 15, 2023·1 cites·10 claims
- 1880US8937488B2Calibration of impedancePS4 LUXCO SARL·Filed 2014·Granted Jan 20, 2015·4 cites·20 claims
- 1980US7355919B2Semiconductor storage device and refresh control method thereforELPIDA MEMORY INC·Filed 2007·Granted Apr 8, 2008·9 cites·2 claims
- 2080US6518835B2Semiconductor integrated circuit device having an optimal circuit layout to ensure stabilization of internal source voltages without lowering circuit functions and/or operating performanceHITACHI LTD·Filed 2002·Granted Feb 11, 2003·26 cites·12 claims
- 2177US7642843B2Reference voltage generating circuit and semiconductor integrated circuit deviceELPIDA MEMORY INC·Filed 2008·Granted Jan 5, 2010·10 cites·15 claims
- 2276US10481819B2Memory devices with multiple sets of latencies and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2017·Granted Nov 19, 2019·2 cites·22 claims
- 2374US7764553B2Semiconductor memory device and control method thereofELPIDA MEMORY INC·Filed 2008·Granted Jul 27, 2010·8 cites·8 claims
- 2473US12394456B2Apparatuses and methods including dice latches in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Aug 19, 2025·0 cites·13 claims
- 2573US11914874B2Memory devices with multiple sets of latencies and methods for operating the sameLODESTAR LICENSING GROUP LLC·Filed 2021·Granted Feb 27, 2024·0 cites·31 claims
- 2673US7529986B2Semiconductor device and testing method for sameELPIDA MEMORY INC·Filed 2008·Granted May 5, 2009·7 cites·3 claims
- 2772US8737149B2Semiconductor device performing stress testRIHO YOSHIRO·Filed 2011·Granted May 27, 2014·4 cites·6 claims
- 2871US10795759B2Apparatuses and methods for error correction coding and data bus inversion for semiconductor memoriesMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 6, 2020·2 cites·20 claims
- 2970USRE47840ETesting circuits in stacked wafers using a connected electrode in the first waferPS4 LUXCO SARL·Filed 2015·Granted Feb 4, 2020·1 cites·24 claims
- 3069US7864618B2Semiconductor memory deviceELPIDA MEMORY INC·Filed 2008·Granted Jan 4, 2011·7 cites·13 claims
- 3168USRE49390ETesting a circuit in a semiconductor deviceLONGITUDE LICENSING LTD·Filed 2020·Granted Jan 24, 2023·0 cites·28 claims
- 3268US11150821B2Memory devices with multiple sets of latencies and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2019·Granted Oct 19, 2021·0 cites·31 claims
- 3367US9640240B2Partial access mode for dynamic random access memoryMICRON TECHNOLOGY INC·Filed 2014·Granted May 2, 2017·3 cites·16 claims
- 3467US8503261B2Semiconductor deviceRIHO YOSHIRO·Filed 2012·Granted Aug 6, 2013·1 cites·20 claims
- 3566US8908411B2Semiconductor deviceELPIDA MEMORY INC·Filed 2013·Granted Dec 9, 2014·1 cites·20 claims
- 3664US11314591B2Apparatuses and methods for error correction coding and data bus inversion for semiconductor memoriesMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 26, 2022·0 cites·21 claims
- 3764US10976945B2Memory devices with multiple sets of latencies and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2018·Granted Apr 13, 2021·0 cites·21 claims
- 3864US8988919B2Semiconductor device having a control chip stacked with a controlled chipPS4 LUXCO SARL·Filed 2014·Granted Mar 24, 2015·1 cites·43 claims
- 3963US11335393B2Semiconductor device performing refresh operation in deep sleep modeMICRON TECHNOLOGY INC·Filed 2021·Granted May 17, 2022·0 cites·20 claims
- 4063US10923171B2Semiconductor device performing refresh operation in deep sleep modeMICRON TECHNOLOGY INC·Filed 2018·Granted Feb 16, 2021·1 cites·18 claims
- 4163US9053821B2Semiconductor device performing stress testPS4 LUXCO SARL·Filed 2014·Granted Jun 9, 2015·2 cites·10 claims
- 4263US8116156B2Semiconductor memory deviceRIHO YOSHIRO·Filed 2009·Granted Feb 14, 2012·5 cites·9 claims
- 4360US2025316301A1Apparatuses and methods for activation counter initializationMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 4458US6411160B1Semiconductor integrated circuit deviceHITACHI LTD·Filed 1999·Granted Jun 25, 2002·20 cites·20 claims
- 4557US7940583B2Semiconductor memory device, control method therefor, and method for determining repair possibility of defective addressELPIDA MEMORY INC·Filed 2009·Granted May 10, 2011·3 cites·18 claims
- 4656US8938570B2Semiconductor device and method of manufacturing the samePS4 LUXCO SARL·Filed 2014·Granted Jan 20, 2015·0 cites·20 claims
- 4756US8837242B2Semiconductor device and method including redundant bit line provided to replace defective bit lineRIHO YOSHIRO·Filed 2014·Granted Sep 16, 2014·1 cites·17 claims
- 4856US2024170091A1System Error Correction Code (ECC) Circuitry RoutingMICRON TECHNOLOGY INC·Filed 2023·Application pending·0 cites
- 4945US2008067551A1Semiconductor device having pseudo power supply wiring and method of designing the sameELPIDA MEMORY INC·Filed 2007·Application pending·0 cites
- 5042US8638625B2Semiconductor device having redundant bit line provided to replace defective bit lineRIHO YOSHIRO·Filed 2012·Granted Jan 28, 2014·0 cites·14 claims
Showing the top 50 of 57 patent records by PatentIndex Score.
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