Inventor · disambiguated record
Hiroya Kirimura
Also filed as: KIRIMURA HIROYA
19 granted patents·9 pending applications·848 citations·filing 1994–2018
93Inventor score
Top patents by PatentIndex Score
28 records- 0197US5562952APlasma-CVD method and apparatusNISSIN ELECTRIC CO LTD·Filed 1995·Granted Oct 8, 1996·538 cites·32 claims
- 0296US6383896B1Thin film forming method and thin film forming apparatusNISSIN ELECTRIC CO LTD·Filed 2000·Granted May 7, 2002·172 cites·21 claims
- 0388US6391114B1Vacuum processing apparatusNISSIN ELECTRIC CO LTD·Filed 2000·Granted May 21, 2002·48 cites·15 claims
- 0481US5556474APlasma processing apparatusNISSIN ELECTRIC CO LTD·Filed 1994·Granted Sep 17, 1996·49 cites·18 claims
- 0576US10725048B2Method for detecting test substanceSYSMEX CORP·Filed 2018·Granted Jul 28, 2020·1 cites·18 claims
- 0669US6258173B1Film forming apparatus for forming a crystalline silicon filmNISSIN ELECTRIC CO LTD·Filed 1999·Granted Jul 10, 2001·19 cites·11 claims
- 0754US9885661B2Analyte detection method, fluorescence detection method, and fluorescence detection apparatus using sameSYSMEX CORP·Filed 2014·Granted Feb 6, 2018·0 cites·18 claims
- 0853US11372012B2Dispensing robot, method of controlling dispensing robot, and dispensing methodKAWASAKI HEAVY IND LTD·Filed 2018·Granted Jun 28, 2022·0 cites·8 claims
- 0953US2015093836A1Method for controlling dissociation of double stranded nucleic acid, method for controlling strand exchange reaction of double stranded nucleic acid and method for amplifying nucleic acidSYSMEX CORP·Filed 2014·Application pending·0 cites
- 1052US2010108539A1Method for detecting analyte, detection apparatus, and test chipSYSMEX CORP·Filed 2009·Application pending·0 cites
- 1152US2010112578A1Test chip, detection apparatus, and method for detecting analyteSYSMEX CORP·Filed 2009·Application pending·0 cites
- 1250US6192828B1Thin film forming device for forming silicon thin film having crystallinityNISSIN ELECTRIC CO LTD·Filed 1999·Granted Feb 27, 2001·14 cites·16 claims
- 1350US2014291166A1Method and kit for electrochemically detecting analyteSYSMEX CORP·Filed 2014·Application pending·0 cites
- 1446US7393935B1Method of selective arrangement of ferritinMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Granted Jul 1, 2008·0 cites·11 claims
- 1543US10066261B2Method for amplifying nucleic acidSYSMEX CORP·Filed 2015·Granted Sep 4, 2018·0 cites·19 claims
- 1643US8920626B2Method of electrochemically detecting a sample substanceSUZUKI SEIGO·Filed 2011·Granted Dec 30, 2014·0 cites·14 claims
- 1743US7901978B2Method of fabricating thin-film transistorNAT UNIV CORP NARA INST·Filed 2006·Granted Mar 8, 2011·0 cites·5 claims
- 1842US9157884B2Method for electrochemically detecting target substance, method for electrochemically detecting analyte, and detection setSEIKE MASAYOSHI·Filed 2011·Granted Oct 13, 2015·0 cites·14 claims
- 1942US2001032589A1Film forming apparatus and method of forming a crystalline silicon filmNISSIN ELECTRIC CO LTD·Filed 2001·Application pending·0 cites
- 2041US6051120AThin film forming apparatusNISSIN ELECTRIC CO LTD·Filed 1998·Granted Apr 18, 2000·5 cites·16 claims
- 2141US2012267258A1Method for electrochemically detecting analyteURAOKA YUKIHARU·Filed 2012·Application pending·0 cites
- 2238US2004076763A1Apparatus and method for forming a thin flimFiled 2003·Application pending·0 cites
- 2337US10267759B2Method of detecting test substanceSYSMEX CORP·Filed 2015·Granted Apr 23, 2019·0 cites·17 claims
- 2437US9057688B2Detection device for detecting a test substanceHORI NOBUYASU·Filed 2011·Granted Jun 16, 2015·0 cites·17 claims
- 2536US9157885B2Method of electrochemically detecting target substance, method of electrochemically detecting analyte, test chip, and detection setIWANAGA SHIGEKI·Filed 2011·Granted Oct 13, 2015·0 cites·11 claims
- 2636US2018011054A1Metal ion detection method, test substance detection methodSYSMEX CORP·Filed 2017·Application pending·0 cites
- 2734US2012161268A1Photocurrent detection electrode, manufacturing method, and working electrode substrateIWANAGA SHIGEKI·Filed 2011·Application pending·0 cites
- 2832US6358313B1Method of manufacturing a crystalline silicon base semiconductor thin filmSHARP KK·Filed 1999·Granted Mar 19, 2002·2 cites·16 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →