Inventor · disambiguated record
Nobuaki Yamanaka
Also filed as: YAMANAKA NOBUAKI
6 granted patents·13 citations·filing 1998–2019
70Inventor score
Files withMITSUBISHI ELECTRIC CORP6
Top patents by PatentIndex Score
6 records- 0143US6346482B2Semiconductor device having an improved contact structure and a manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Feb 12, 2002·13 cites·14 claims
- 0241US10211056B2Semiconductor device manufacturing methodMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Feb 19, 2019·0 cites·4 claims
- 0339US9881818B2Method for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Jan 30, 2018·0 cites·5 claims
- 0437US10677585B2Film thickness measuring apparatusMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Jun 9, 2020·0 cites·11 claims
- 0533US10074578B2Semiconductor device and method for producing the sameMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Sep 11, 2018·0 cites·13 claims
- 0625US10242876B2Method for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Mar 26, 2019·0 cites·5 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →