Inventor · disambiguated record
Tetsuhiro Fukao
Also filed as: FUKAO TETSUHIRO
10 granted patents·2 pending applications·30 citations·filing 1998–2023
83Inventor score
Top patents by PatentIndex Score
12 records- 0175US9563065B2Optical module and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Feb 7, 2017·2 cites·10 claims
- 0259US12287279B2Semiconductor laser inspection apparatusMITSUBISHI ELECTRIC CORP·Filed 2023·Granted Apr 29, 2025·0 cites·13 claims
- 0358US12429498B2Inspection deviceMITSUBISHI ELECTRIC CORP·Filed 2021·Granted Sep 30, 2025·0 cites·19 claims
- 0457US8184985B2Control circuit for optical transmitter/receiverKONDO HARUFUSA·Filed 2008·Granted May 22, 2012·4 cites·2 claims
- 0554US12123906B2Electronic device inspection apparatusMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Oct 22, 2024·0 cites·20 claims
- 0648US12259408B2Semiconductor laser inspection apparatusMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Mar 25, 2025·0 cites·2 claims
- 0743US6346482B2Semiconductor device having an improved contact structure and a manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Feb 12, 2002·13 cites·14 claims
- 0842US8385750B2Optical transmission deviceMITSUBISHI ELECTRIC CORP·Filed 2009·Granted Feb 26, 2013·0 cites·16 claims
- 0941US6156639AMethod for manufacturing contact structureMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Dec 5, 2000·11 cites·13 claims
- 1041US2025102566A1Device inspection apparatus and device inspection methodMITSUBISHI ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 1139US2003226070A1Clock extraction circuitMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 1235US9484708B2Dual wavelength laser module with constant output intensityMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Nov 1, 2016·0 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →