Inventor · disambiguated record
Yasutaka Tsuruki
Also filed as: TSURUKI YASUTAKA
7 granted patents·78 citations·filing 1995–2005
85Inventor score
Files withADVANTEST CORP7
Top patents by PatentIndex Score
7 records- 0172US6791389B2Variable delay circuit and a testing apparatus for a semiconductor circuitADVANTEST CORP·Filed 2002·Granted Sep 14, 2004·17 cites·12 claims
- 0268US6768360B2Timing signal generation circuit and semiconductor test device with the sameADVANTEST CORP·Filed 2001·Granted Jul 27, 2004·15 cites·6 claims
- 0367US7187192B2Semiconductor test device having clock recovery circuitADVANTEST CORP·Filed 2003·Granted Mar 6, 2007·13 cites·12 claims
- 0466US6956395B2Tester for testing an electronic device using oscillator and frequency dividerADVANTEST CORP·Filed 2004·Granted Oct 18, 2005·13 cites·12 claims
- 0558US7461314B2Test deviceADVANTEST CORP·Filed 2005·Granted Dec 2, 2008·3 cites·12 claims
- 0643US5886536ASemiconductor tester synchronized with external clockADVANTEST CORP·Filed 1995·Granted Mar 23, 1999·12 cites·3 claims
- 0733US5761100APeriod generator for semiconductor testing apparatusADVANTEST CORP·Filed 1995·Granted Jun 2, 1998·5 cites·8 claims
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