Inventor · disambiguated record
Hong-Ji Lee
Also filed as: LEE HONG · LEE HONG-JI
40 granted patents·5 pending applications·350 citations·filing 1996–2023
97Inventor score
Files withMACRONIX INT CO LTD25SAMSUNG ELECTRONICS CO LTD8NANO ARCHITECT RES CORP4LEE HONG-JI3IND TECH RES INST2
Top patents by PatentIndex Score
45 records- 0198US8383512B2Method for making multilayer connection structureMACRONIX INT CO LTD·Filed 2011·Granted Feb 26, 2013·58 cites·16 claims
- 0292US6451161B1Method and apparatus for generating high-density uniform plasmaNANO ARCHITECT RES CORP·Filed 2000·Granted Sep 17, 2002·103 cites·21 claims
- 0387US6319858B1Methods for reducing a dielectric constant of a dielectric film and for forming a low dielectric constant porous filmNANO ARCHITECT RES CORP·Filed 2000·Granted Nov 20, 2001·50 cites·29 claims
- 0483US5958087APreparation of cyanine dye for high density optical recording diskIND TECH RES INST·Filed 1999·Granted Sep 28, 1999·23 cites·15 claims
- 0579US9012282B2Self-aligned liner method of avoiding PL gate damageMACRONIX INT CO LTD·Filed 2013·Granted Apr 21, 2015·5 cites·17 claims
- 0677US6398430B1Semiconductor device fabrication systemSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jun 4, 2002·19 cites·15 claims
- 0775US9269660B2Multilayer connection structureMACRONIX INT CO LTD·Filed 2013·Granted Feb 23, 2016·3 cites·10 claims
- 0872US7629583B2Method and apparatus for analyzing a photoresist filmSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Dec 8, 2009·4 cites·4 claims
- 0971US7842981B2Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 30, 2010·4 cites·7 claims
- 1070US7427519B2Method of detecting end point of plasma etching processMACRONIX INT CO LTD·Filed 2007·Granted Sep 23, 2008·3 cites·20 claims
- 1168US9425086B2Method of controlling contact hole profile for metal fill-inMACRONIX INT CO LTD·Filed 2013·Granted Aug 23, 2016·2 cites·20 claims
- 1268US5900348ACyanine dyes mixture as optical recording mediaUNIV TSINGHUA·Filed 1997·Granted May 4, 1999·12 cites·15 claims
- 1367US7435681B2Methods of etching stacks having metal layers and hard mask layersMACRONIX INT CO LTD·Filed 2006·Granted Oct 14, 2008·2 cites·20 claims
- 1465US8304175B2Patterning methodLEE HONG-JI·Filed 2009·Granted Nov 6, 2012·2 cites·18 claims
- 1565US6589706B1Preparation of cyanine dye for high density optical recording diskIND TECH RES INST·Filed 2000·Granted Jul 8, 2003·6 cites·17 claims
- 1665US6462483B1Induction plasma processing chamberNANO ARCHITECT RES CORP·Filed 1999·Granted Oct 8, 2002·20 cites·12 claims
- 1763US7550390B2Method and apparatus for dielectric etching during integrated circuit fabricationMACRONIX INT CO LTD·Filed 2006·Granted Jun 23, 2009·2 cites·20 claims
- 1862US9449915B2Semiconductor device and method of manufacturing the sameMACRONIX INT CO LTD·Filed 2014·Granted Sep 20, 2016·1 cites·17 claims
- 1961US9305840B2Cluster system for eliminating barrier overhangMACRONIX INT CO LTD·Filed 2013·Granted Apr 5, 2016·2 cites·20 claims
- 2061US6358672B2Method of forming semiconductor device pattern including cross-linking and flow baking a positive photoresistSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Mar 19, 2002·24 cites·9 claims
- 2160US12484227B2Memory device with source line over a bonding padMACRONIX INT CO LTD·Filed 2022·Granted Nov 25, 2025·0 cites·13 claims
- 2259US9922876B1Interconnect structure and fabricating method thereofMACRONIX INT CO LTD·Filed 2017·Granted Mar 20, 2018·1 cites·17 claims
- 2358US9224803B2Formation of a high aspect ratio contact holeMACRONIX INT CO LTD·Filed 2013·Granted Dec 29, 2015·1 cites·15 claims
- 2455US12048154B2Memory device and manufacturing method thereofMACRONIX INT CO LTD·Filed 2021·Granted Jul 23, 2024·0 cites·9 claims
- 2553US2024164099A1Memory device and method for forming the sameMACRONIX INT CO LTD·Filed 2023·Application pending·0 cites
- 2652US7494761B2Cyclodextrin derivative, photoresist composition including the cyclodextrin derivative and method of forming a pattern using the photoresist compositionSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Feb 24, 2009·0 cites·11 claims
- 2749US11510579B2Apparatus and method for determining calibration timing for blood pressure measurement in electronic deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 29, 2022·0 cites·9 claims
- 2847US9337036B2Method of forming copper sulfide film for reducing copper oxidization and lossMACRONIX INT CO LTD·Filed 2014·Granted May 10, 2016·0 cites·20 claims
- 2947US9299667B2Method of shaping densely arranged PL gates and peripheral MOS gates for ILD oxide fill-inMACRONIX INT CO LTD·Filed 2014·Granted Mar 29, 2016·0 cites·11 claims
- 3046US9287285B2Self-aligned liner method of avoiding PL gate damageMACRONIX INT CO LTD·Filed 2015·Granted Mar 15, 2016·0 cites·18 claims
- 3146US2008311527A1Method of forming protection layer on photoresist pattern and method of forming fine pattern using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 3245US8372714B2Semiconductor device and method of manufacturing a semiconductor deviceMACRONIX INT CO LTD·Filed 2010·Granted Feb 12, 2013·0 cites·12 claims
- 3345US7410593B2Plasma etching methods using nitrogen memory species for sustaining glow dischargeMACRONIX INT CO LTD·Filed 2006·Granted Aug 12, 2008·0 cites·17 claims
- 3444US8697340B2Semiconductor structure and method of fabricating the sameLEE HONG-JI·Filed 2008·Granted Apr 15, 2014·0 cites·18 claims
- 3543US2016190334A1Memory device and method of manufacturing the sameMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 3643US2016064479A1Semiconductor device and manufacturing method of the sameMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 3742US10204859B2Interconnect structure and fabricating method thereofMACRONIX INT CO LTD·Filed 2017·Granted Feb 12, 2019·0 cites·20 claims
- 3842US8445346B2Method of reducing wordline shortingLEE HONG-JI·Filed 2009·Granted May 21, 2013·0 cites·21 claims
- 3942US8076778B2Method for preventing Al-Cu bottom damage using TiN linerWEI KUO LIANG·Filed 2009·Granted Dec 13, 2011·0 cites·16 claims
- 4037US10424593B2Three-dimensional non-volatile memory and manufacturing method thereofMACRONIX INT CO LTD·Filed 2018·Granted Sep 24, 2019·0 cites·19 claims
- 4137US5848315ADevelopment monitoring apparatus and method adopting the sameSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Dec 8, 1998·1 cites·5 claims
- 4236US9881809B2Semiconductor device and method of fabricating the sameMACRONIX INT CO LTD·Filed 2015·Granted Jan 30, 2018·0 cites·4 claims
- 4334US2002121345A1Multi-chamber system for semiconductor processNANO ARCHITECT RES CORP·Filed 2001·Application pending·0 cites
- 4433US9627247B2Semiconductor device and method of fabricating the sameMACRONIX INT CO LTD·Filed 2015·Granted Apr 18, 2017·0 cites·8 claims
- 4529US5698644AProcess for preparing syndiotactic vinyl aromatic polymers under high pressure inert gasNAT SCIENCE COUNCIL·Filed 1997·Granted Dec 16, 1997·2 cites·5 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →