Inventor · disambiguated record
Kazuhiko Hidaka
Also filed as: HIDAKA KAZUHIKO
39 granted patents·6 pending applications·367 citations·filing 1996–2024
97Inventor score
Top patents by PatentIndex Score
45 records- 0196US9618312B2Measuring probeMITUTOYO CORP·Filed 2015·Granted Apr 11, 2017·17 cites·22 claims
- 0295US10914570B2Inductive position detection configuration for indicating a measurement device stylus positionMITUTOYO CORP·Filed 2019·Granted Feb 9, 2021·15 cites·25 claims
- 0394US9605943B2Measuring probeMITUTOYO CORP·Filed 2015·Granted Mar 28, 2017·9 cites·19 claims
- 0494US9285201B2Form measuring instrumentMITUTOYO CORP·Filed 2014·Granted Mar 15, 2016·18 cites·12 claims
- 0593US8665435B2Wavelength detector and contact probe using itMITUTOYO CORP·Filed 2013·Granted Mar 4, 2014·16 cites·9 claims
- 0692US9810529B2Measuring probe for measuring a three-dimensional shape of an object to be measuredMITUTOYO CORP·Filed 2015·Granted Nov 7, 2017·8 cites·13 claims
- 0790US9528824B2Tactile probing systemMITUTOYO CORP·Filed 2015·Granted Dec 27, 2016·15 cites·13 claims
- 0888US10422628B2Measuring probeMITUTOYO CORP·Filed 2017·Granted Sep 24, 2019·4 cites·16 claims
- 0987US7319528B2Surface texture measuring instrumentMITUTOYO CORP·Filed 2005·Granted Jan 15, 2008·11 cites·6 claims
- 1084US9062958B2Image sensor, attitude detector, contact probe, and multi-sensing probeMITUTOYO CORP·Filed 2013·Granted Jun 23, 2015·7 cites·9 claims
- 1184US6307084B1Contact location detecting mechanism of touch signal probeMITUTOYO CORP·Filed 2000·Granted Oct 23, 2001·31 cites·7 claims
- 1282US9869537B2Contact probeMITUTOYO CORP·Filed 2016·Granted Jan 16, 2018·3 cites·11 claims
- 1382US6604295B2Microscopic geometry measuring deviceMITUTOYO CORP·Filed 2001·Granted Aug 12, 2003·35 cites·10 claims
- 1480US10900765B2Form measuring apparatusMITUTOYO CORP·Filed 2018·Granted Jan 26, 2021·2 cites·21 claims
- 1580US9518811B2Form measuring machineMITUTOYO CORP·Filed 2015·Granted Dec 13, 2016·3 cites·19 claims
- 1680US6457366B1Movement control mechanism of contact-type vibrating probeMITUTOYO CORP·Filed 2000·Granted Oct 1, 2002·26 cites·15 claims
- 1779US7100429B2Surface profile measuring instrument and surface profile measuring methodMITUTOYO CORP·Filed 2003·Granted Sep 5, 2006·23 cites·9 claims
- 1879US6484571B1Surface configuration measuring methodMITUTOYO CORP·Filed 2000·Granted Nov 26, 2002·24 cites·12 claims
- 1975US9303968B2Lever type measuring machineMITUTOYO CORP·Filed 2014·Granted Apr 5, 2016·3 cites·9 claims
- 2071US6723262B2Method for manufacturing a honeycomb structure having slitsNGK INSULATORS LTD·Filed 2001·Granted Apr 20, 2004·14 cites·5 claims
- 2171US6516529B2Touch signal probeMITUTOYO CORP·Filed 2001·Granted Feb 11, 2003·17 cites·8 claims
- 2266US5756886ATouch probe with reseat position systemMITUTOYO CORP·Filed 1996·Granted May 26, 1998·30 cites·17 claims
- 2363US12315266B2Position detection system, position detection method, and three-dimensional geometry measurement systemMITUTOYO CORP·Filed 2022·Granted May 27, 2025·0 cites·17 claims
- 2462US6848315B2Vibration detecting system of resilient body and vibrating contact detection probeMITUTOYO CORP·Filed 2002·Granted Feb 1, 2005·9 cites·8 claims
- 2562US6516669B2Vibration-type contact detection sensorMITUTOYO CORP·Filed 2001·Granted Feb 11, 2003·7 cites·17 claims
- 2661US2024302159A1Coordinate measuring machine and in-line measurement systemMITUTOYO CORP·Filed 2024·Application pending·0 cites
- 2761US2024240926A1Measuring system and measurement methodMITUTOYO CORP·Filed 2024·Application pending·0 cites
- 2861US2024345116A1Automatic measuring system and control method for automatic measuring systemMITUTOYO CORP·Filed 2024·Application pending·0 cites
- 2959US9163917B2Lever headMITUTOYO CORP·Filed 2013·Granted Oct 20, 2015·1 cites·8 claims
- 3056US2022290971A1Coordinate measuring apparatusMITUTOYO CORP·Filed 2022·Application pending·0 cites
- 3152US10001358B2Measuring probe and measuring probe systemMITUTOYO CORP·Filed 2016·Granted Jun 19, 2018·0 cites·10 claims
- 3252US8345260B2Method of detecting a movement of a measuring probe and measuring instrumentMITUTOYO CORP·Filed 2009·Granted Jan 1, 2013·2 cites·15 claims
- 3352US7581438B2Surface texture measuring probe and microscope utilizing the sameMITUTOYO CORP·Filed 2005·Granted Sep 1, 2009·1 cites·12 claims
- 3452US6327789B1Touch signal probeMITUTOYO CORP·Filed 1999·Granted Dec 11, 2001·16 cites·19 claims
- 3550US12078478B2Measurement apparatus, control apparatus, and control methodMITUTOYO CORP·Filed 2021·Granted Sep 3, 2024·0 cites·15 claims
- 3650US10415947B2Measurement probe and measuring deviceMITUTOYO CORP·Filed 2017·Granted Sep 17, 2019·0 cites·9 claims
- 3749US11092422B2Measuring apparatus and measuring methodMITUTOYO CORP·Filed 2019·Granted Aug 17, 2021·0 cites·7 claims
- 3845US10113931B2Probe measuring force adjusterMITUTOYO CORP·Filed 2016·Granted Oct 30, 2018·0 cites·8 claims
- 3944US2005173332A1Method and device for sealing end portion of porous structure, and porous structure sealed at end portionNGK INSULATORS LTD·Filed 2005·Application pending·0 cites
- 4043US10788312B2Coordinate measuring unit and method for recognizing measuring probeMITUTOYO CORP·Filed 2018·Granted Sep 29, 2020·0 cites·16 claims
- 4142US10161743B2Measuring probe and measuring probe systemMITUTOYO CORP·Filed 2017·Granted Dec 25, 2018·0 cites·6 claims
- 4241US8606376B2Method of actuating a system, apparatus for modifying a control signal for actuation of a system and method of tuning such an apparatusILLERS HARTMUT·Filed 2009·Granted Dec 10, 2013·0 cites·15 claims
- 4341US2004142055A1Apparatus for manufacturing a honeycomb structure having slitsNGK INSULATORS LTD·Filed 2003·Application pending·0 cites
- 4440US11435560B2Lens substrate stacking position calculating apparatus and programMITUTOYO CORP·Filed 2020·Granted Sep 6, 2022·0 cites·16 claims
- 4540US7642503B2Method to determine a control parameter in a measurement control systemMITUTOYO CORP·Filed 2005·Granted Jan 5, 2010·0 cites·10 claims
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