Inventor · disambiguated record
Alan Philip Franks
Also filed as: FRANKS ALAN PHILIP
11 granted patents·4 pending applications·7 citations·filing 2020–2025
84Inventor score
Files withPROTOCHIPS INC15
Top patents by PatentIndex Score
15 records- 0193US12130858B2Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2023·Granted Oct 29, 2024·1 cites·20 claims
- 0293US11902665B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Feb 13, 2024·4 cites·20 claims
- 0389US10986279B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2020·Granted Apr 20, 2021·2 cites·12 claims
- 0487US2025338020A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 0584US12375815B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Jul 29, 2025·0 cites·20 claims
- 0684US12284445B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Apr 22, 2025·0 cites·20 claims
- 0784US2025053594A1Systems and methods of metadata and image management for reviewing data from transmission electron microscope (tem) sessionsPROTOCHIPS INC·Filed 2024·Application pending·0 cites
- 0880US2025260901A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 0977US12010430B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 1076US11755639B2Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2022·Granted Sep 12, 2023·0 cites·20 claims
- 1174US11455333B1Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2022·Granted Sep 27, 2022·0 cites·20 claims
- 1272US11477388B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Oct 18, 2022·0 cites·20 claims
- 1369US11514586B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Nov 29, 2022·0 cites·25 claims
- 1469US11399138B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Jul 26, 2022·0 cites·10 claims
- 1563US2025029810A1Methods and systems for selectively managing image and metadata from transmission electron microscope (tem) sessions at multiple temporal or spatial resolutionsPROTOCHIPS INC·Filed 2024·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →