Inventor · disambiguated record
Yukikazu Matsuo
Also filed as: MATSUO YUKIKAZU
5 granted patents·2 pending applications·16 citations·filing 2000–2017
71Inventor score
Top patents by PatentIndex Score
7 records- 0155US6335645B1Semiconductor integrated circuit having built-in self-test circuitMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jan 1, 2002·10 cites·7 claims
- 0249US9811450B2Semiconductor test apparatus for controlling testerRENESAS ELECTRONICS CORP·Filed 2014·Granted Nov 7, 2017·0 cites·6 claims
- 0349US6930931B2Program counter circuitRENESAS TECH CORP·Filed 2003·Granted Aug 16, 2005·4 cites·5 claims
- 0447US2018039571A1Semiconductor test apparatus for controlling testerRENESAS ELECTRONICS CORP·Filed 2017·Application pending·0 cites
- 0545US9557384B2Testing deviceRENESAS ELECTRONICS CORP·Filed 2013·Granted Jan 31, 2017·0 cites·6 claims
- 0639US6802034B2Test pattern generation circuit and method for use with self-diagnostic circuitRENESAS TECH CORP·Filed 2002·Granted Oct 5, 2004·2 cites·5 claims
- 0730US2003023913A1Testing device of semiconductor integrated circuit and test method thereforMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
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