Inventor · disambiguated record
Alex Tokar
Also filed as: TOKAR ALEX
7 granted patents·1 pending application·42 citations·filing 2005–2015
82Inventor score
Files withJORDAN VALLEY SEMICONDUCTORS4JORDAN VALLEY SEMICONDUCTORS LTD2JORDAN VALLEY APPLIED RADIATION LTD1MAZOR ISAAC1
Top patents by PatentIndex Score
8 records- 0191US9829448B2Measurement of small features using XRFJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Nov 28, 2017·8 cites·20 claims
- 0288US7245695B2Detection of dishing and tilting using X-ray fluorescenceJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Jul 17, 2007·14 cites·25 claims
- 0382US9632043B2Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRFJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Apr 25, 2017·7 cites·20 claims
- 0481US7649978B2Automated selection of X-ray reflectometry measurement locationsJORDAN VALLEY SEMICONDUCTORS·Filed 2008·Granted Jan 19, 2010·7 cites·20 claims
- 0576US9389192B2Estimation of XRF intensity from an array of micro-bumpsJORDAN VALLEY SEMICONDUCTORS·Filed 2014·Granted Jul 12, 2016·2 cites·17 claims
- 0675US7321652B2Multi-detector EDXRDJORDAN VALLEY SEMICONDUCTORS·Filed 2006·Granted Jan 22, 2008·4 cites·16 claims
- 0746US2007274447A1Automated selection of X-ray reflectometry measurement locationsMAZOR ISAAC·Filed 2007·Application pending·0 cites
- 0843US9390984B2X-ray inspection of bumps on a semiconductor substrateJORDAN VALLEY SEMICONDUCTORS·Filed 2012·Granted Jul 12, 2016·0 cites·14 claims
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