Inventor · disambiguated record
Peter Feeley
Also filed as: FEELEY PETER · FEELEY PETER S · FEELEY PETER SEAN
205 granted patents·15 pending applications·1,229 citations·filing 1994–2025
99Inventor score
Files withMICRON TECHNOLOGY INC185RADKE WILLIAM H7FEELEY PETER4SHEN ZHENLEI3ADVANCED HARDWARE ARCHITECTURE2
Top patents by PatentIndex Score
220 records- 0199US10347344B2Read voltage calibration based on host IO operationsMICRON TECHNOLOGY INC·Filed 2017·Granted Jul 9, 2019·61 cites·31 claims
- 0298US11410734B1Voltage bin selection for blocks of a memory device after power up of the memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 9, 2022·8 cites·20 claims
- 0397US11676664B2Voltage bin selection for blocks of a memory device after power up of the memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 13, 2023·4 cites·20 claims
- 0497US11437108B1Voltage bin calibration based on a temporary voltage shift offsetMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 6, 2022·5 cites·20 claims
- 0597US11256620B1Cache management based on memory device over-provisioningMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 22, 2022·8 cites·19 claims
- 0697US11226896B2Trim setting determination on a memory deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 18, 2022·6 cites·20 claims
- 0797US10359933B2Memory devices and electronic systems having a hybrid cache including static and dynamic caches with single and multiple bits per cell, and related methodsMICRON TECHNOLOGY INC·Filed 2016·Granted Jul 23, 2019·19 cites·32 claims
- 0897US9921898B1Identifying asynchronous power lossMICRON TECHNOLOGY INC·Filed 2016·Granted Mar 20, 2018·22 cites·26 claims
- 0996US11886726B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 30, 2024·3 cites·20 claims
- 1096US11836078B2Trim setting determination on a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 5, 2023·4 cites·20 claims
- 1196US11593005B2Managing voltage bin selection for blocks of a memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 28, 2023·4 cites·20 claims
- 1296US10777284B2Read voltage calibration based on host IO operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 15, 2020·4 cites·24 claims
- 1396US8412880B2Memory system controller to manage wear leveling across a plurality of storage nodesLEIBOWITZ ROBERT N·Filed 2009·Granted Apr 2, 2013·335 cites·40 claims
- 1496US8103936B2System and method for data read of a synchronous serial interface NANDPEKNY THEODORE T·Filed 2007·Granted Jan 24, 2012·32 cites·25 claims
- 1595US11709727B2Managing error-handling flows in memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 25, 2023·3 cites·19 claims
- 1695US10365854B1Tracking data temperatures of logical block addressesMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 30, 2019·14 cites·25 claims
- 1795US8451664B2Determining and using soft data in memory devices and systemsRADKE WILLIAM H·Filed 2010·Granted May 28, 2013·22 cites·12 claims
- 1895US5532693AAdaptive data compression system with systolic string matching logicADVANCED HARDWARE ARCHITECTURE·Filed 1994·Granted Jul 2, 1996·211 cites·31 claims
- 1994US11709633B2Adjusting scan event thresholds to mitigate memory errorsMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 25, 2023·2 cites·20 claims
- 2094US9235546B2System and method for data read of a synchronous serial interface NANDMICRON TECHNOLOGY INC·Filed 2014·Granted Jan 12, 2016·17 cites·22 claims
- 2194US7770079B2Error scanning in flash memoryMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 3, 2010·26 cites·47 claims
- 2293US12079517B2Buffer allocation for reducing block transit penaltyMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 3, 2024·2 cites·20 claims
- 2393US11269553B2Adjusting scan event thresholds to mitigate memory errorsMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 8, 2022·3 cites·20 claims
- 2493US11231863B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 25, 2022·3 cites·16 claims
- 2593US10324839B2Trim setting determination on a memory deviceMICRON TECHNOLOGY INC·Filed 2017·Granted Jun 18, 2019·8 cites·29 claims
- 2693US10318378B2Redundant array of independent NAND for a three-dimensional memory arrayMICRON TECHNOLOGY INC·Filed 2016·Granted Jun 11, 2019·9 cites·23 claims
- 2793US9318220B2Memory cell coupling compensationMICRON TECHNOLOGY INC·Filed 2014·Granted Apr 19, 2016·13 cites·18 claims
- 2893US8358542B2Methods, devices, and systems for adjusting sensing voltages in devicesMICRON TECHNOLOGY INC·Filed 2011·Granted Jan 22, 2013·15 cites·34 claims
- 2992US12001721B2Multiple-pass programming of memory cells using temporary parity generationMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 4, 2024·2 cites·20 claims
- 3092US9208833B2Sequential memory operation without deactivating access line signalsMICRON TECHNOLOGY INC·Filed 2013·Granted Dec 8, 2015·11 cites·11 claims
- 3191US11853207B2Configurable trim settings on a memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Dec 26, 2023·2 cites·12 claims
- 3291US10586602B2Read voltage calibration based on host IO operationsMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 10, 2020·6 cites·25 claims
- 3391US10380018B2Garbage collectionMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 13, 2019·6 cites·27 claims
- 3491US9269450B2Methods, devices, and systems for adjusting sensing voltages in devicesMICRON TECHNOLOGY INC·Filed 2014·Granted Feb 23, 2016·11 cites·16 claims
- 3591US8356216B2Error scanning in flash memoryMICRON TECHNOLOGY INC·Filed 2012·Granted Jan 15, 2013·11 cites·18 claims
- 3690US11587639B2Voltage calibration scans to reduce memory device overheadMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 21, 2023·2 cites·20 claims
- 3790US11043278B2Read voltage calibration based on host IO operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 22, 2021·2 cites·20 claims
- 3890US10761980B2Trim setting determination on a memory deviceMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 1, 2020·6 cites·20 claims
- 3990US10431319B2Selectable trim settings on a memory deviceMICRON TECHNOLOGY INC·Filed 2017·Granted Oct 1, 2019·5 cites·29 claims
- 4090US9552257B2Memory cell coupling compensationMICRON TECHNOLOGY INC·Filed 2016·Granted Jan 24, 2017·8 cites·20 claims
- 4189US11042306B2Memory managementMICRON TECHNOLOGY INC·Filed 2019·Granted Jun 22, 2021·4 cites·20 claims
- 4289US10509722B2Memory device with dynamic cache managementMICRON TECHNOLOGY INC·Filed 2017·Granted Dec 17, 2019·4 cites·24 claims
- 4389US8918600B2Methods for controlling host memory access with memory devices and systemsGALBO NEAL A·Filed 2012·Granted Dec 23, 2014·11 cites·24 claims
- 4489US8077515B2Methods, devices, and systems for dealing with threshold voltage change in memory devicesSHEN ZHENLEI·Filed 2009·Granted Dec 13, 2011·15 cites·33 claims
- 4588US11854634B2Selectable trim settings on a memory deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 26, 2023·2 cites·18 claims
- 4688US11037630B2NAND temperature data managementMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 15, 2021·2 cites·20 claims
- 4788US10777292B2Selectable trim settings on a memory deviceMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 15, 2020·5 cites·20 claims
- 4888US10691377B2Adjusting scan event thresholds to mitigate memory errorsMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 23, 2020·6 cites·20 claims
- 4988US8352833B2System and method for data read of a synchronous serial interface NANDMICRON TECHNOLOGY INC·Filed 2012·Granted Jan 8, 2013·8 cites·20 claims
- 5087US10942796B2Identifying asynchronous power lossMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 9, 2021·3 cites·20 claims
Showing the top 50 of 220 patent records by PatentIndex Score.
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