Inventor · disambiguated record

Laiq Chughtai

Also filed as: CHUGHTAI LAIQ

2 granted patents·4 citations·filing 2003–2006

45Inventor score

Technology areasG01R

Files withALTERA CORP2

Top patents by PatentIndex Score

2 records

0147US7212032B1Method and apparatus for monitoring yield of integrated circuitsALTERA CORP·Filed 2006·Granted May 1, 2007·1 cites·18 claims
0238US7685485B2Functional failure analysis techniques for programmable integrated circuitsALTERA CORP·Filed 2003·Granted Mar 23, 2010·3 cites·24 claims

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Laiq Chughtai — Patent Inventor | PatentIndex