Inventor · disambiguated record

Kaiyu Ren

Also filed as: REN KAIYU

2 granted patents·12 citations·filing 2003–2003

55Inventor score

Technology areasG01R

Files withALTERA CORP2

Top patents by PatentIndex Score

2 records

0156US7194666B1Bit error rate tester implemented in a programmable logic deviceALTERA CORP·Filed 2003·Granted Mar 20, 2007·9 cites·28 claims
0238US7685485B2Functional failure analysis techniques for programmable integrated circuitsALTERA CORP·Filed 2003·Granted Mar 23, 2010·3 cites·24 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →