Inventor · disambiguated record
Wei-Chung Hu
Also filed as: HU WEI · HU WEI-CHUNG
14 granted patents·6 pending applications·68 citations·filing 2010–2024
88Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD11QINGDAO HAIER BIOMEDICAL CO LTD3LU YANQING2CHEN JUI-HSIANG1SHENZHEN MEIYUNJI NETWORK TECH CO LTD1
Top patents by PatentIndex Score
20 records- 0197US9575366B2Fast switchable and high diffraction efficiency grating ferroelectric liquid crystal cellUNIV HONG KONG SCIENCE & TECH·Filed 2012·Granted Feb 21, 2017·56 cites·9 claims
- 0292US11429019B2Method for manufacturing semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 30, 2022·2 cites·20 claims
- 0387US10866508B2Method for manufacturing photomask and semiconductor manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 15, 2020·2 cites·20 claims
- 0486US2024385507A1Mask defect preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0585US10304178B2Method and system for diagnosing a semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 28, 2019·5 cites·20 claims
- 0684US12124163B2Mask defect preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 22, 2024·0 cites·20 claims
- 0784US11402743B2Mask defect preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 2, 2022·1 cites·20 claims
- 0880US11860530B2Mask defect preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
- 0973US12174529B2Method for manufacturing semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 24, 2024·0 cites·20 claims
- 1073US11669957B2Semiconductor wafer measurement method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 6, 2023·0 cites·20 claims
- 1170US11094057B2Semiconductor wafer measurement method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 17, 2021·0 cites·20 claims
- 1268US9796002B2Particle removal using periodic piezoelectric coefficient materialLU YANQING·Filed 2012·Granted Oct 24, 2017·2 cites·21 claims
- 1359US10762621B2Semiconductor wafer measurement method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Sep 1, 2020·0 cites·20 claims
- 1456US2024320621A1Inventory target-based product restock method and systemSHENZHEN MEIYUNJI NETWORK TECH CO LTD·Filed 2024·Application pending·0 cites
- 1547US8644652B2Slotted optical fibers and methods and apparatuses for the sameXU FEI·Filed 2011·Granted Feb 4, 2014·0 cites·21 claims
- 1643US2024150857A1Method and device for power allocation in carbon dioxide incubator, and carbon dioxide incubatorQINGDAO HAIER BIOMEDICAL CO LTD·Filed 2022·Application pending·0 cites
- 1736US2024318119A1Method and device for regulating temperature of incubator, and incubatorQINGDAO HAIER BIOMEDICAL CO LTD·Filed 2022·Application pending·0 cites
- 1836US2024299955A1Method and device for temperature control of centrifuge, centrifuge, and storage mediumQINGDAO HAIER BIOMEDICAL CO LTD·Filed 2022·Application pending·0 cites
- 1934US2012150078A1Medical dressing and negative pressure wound therapy apparatus using the sameCHEN JUI-HSIANG·Filed 2011·Application pending·0 cites
- 2033US9116300B2Multi-mode interferometer techniquesLU YANQING·Filed 2010·Granted Aug 25, 2015·0 cites·17 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →