Inventor · disambiguated record
Coen Adrianus Verschuren
Also filed as: VERSCHUREN COEN · VERSCHUREN COEN A · VERSCHUREN COEN ADRIANUS · VERSCHUREN COEN ADRIANUS JOHANNES
44 granted patents·50 pending applications·167 citations·filing 2002–2024
97Inventor score
Files withKONINKL PHILIPS ELECTRONICS NV44ASML NETHERLANDS BV20VERSCHUREN COEN ADRIANUS11VERSCHUREN COEN A5SIEMENS HEALTHINEERS NEDERLAND B V2
Top patents by PatentIndex Score
94 records- 0194US8310149B2Transparent OLED device employing a mirror layer having a pattern of nontransparent and transparent zonesLIFKA HERBERT·Filed 2009·Granted Nov 13, 2012·32 cites·10 claims
- 0290US10712669B2Method and apparatus for direct write maskless lithographyASML NETHERLANDS BV·Filed 2016·Granted Jul 14, 2020·4 cites·20 claims
- 0390US10342108B2Metrology methods, radiation source, metrology apparatus and device manufacturing methodASML NETHERLANDS BV·Filed 2016·Granted Jul 2, 2019·5 cites·20 claims
- 0487US12259659B2Aligning a distorted imageASML NETHERLANDS BV·Filed 2022·Granted Mar 25, 2025·1 cites·15 claims
- 0587US9658219B2Microelectronic sensor device for detecting label particlesVERSCHUREN COEN ADRIANUS·Filed 2007·Granted May 23, 2017·11 cites·18 claims
- 0687US9599292B2Light emitting module, a lamp, a luminaire and a display deviceJAGT HENDRIK JOHANNES BOUDEWIJN·Filed 2012·Granted Mar 21, 2017·19 cites·17 claims
- 0786US10527950B2Apparatus for direct write maskless lithographyASML NETHERLANDS BV·Filed 2017·Granted Jan 7, 2020·3 cites·20 claims
- 0886US9995831B2X-ray detector with improved spatial gain uniformity and resolution and method of fabricating such X-ray detectorVERSCHUREN COEN ADRIANUS·Filed 2011·Granted Jun 12, 2018·8 cites·27 claims
- 0985US12500063B2Method and apparatus for inspectionASML NETHERLANDS BV·Filed 2024·Granted Dec 16, 2025·0 cites·20 claims
- 1085US9082946B2Light emitting module, a lamp, a luminaire and a display deviceVDOVIN OLEXANDR VALENTYNOVYCH·Filed 2012·Granted Jul 14, 2015·16 cites·15 claims
- 1184US8411274B2Microelectronic sensor device for optical examinations on a wetted surfaceVERSCHUREN COEN ADRIANUS·Filed 2008·Granted Apr 2, 2013·9 cites·16 claims
- 1283US8797028B2Sensor device for target particles in a sampleVERSCHUREN COEN ADRIANUS JOHANNES·Filed 2008·Granted Aug 5, 2014·13 cites·13 claims
- 1377US11232960B2Pick-and-place tool having multiple pick up elementsASML NETHERLANDS BV·Filed 2017·Granted Jan 25, 2022·2 cites·20 claims
- 1476US10928736B2Method and apparatus for direct write maskless lithographyASML NETHERLANDS BV·Filed 2016·Granted Feb 23, 2021·2 cites·20 claims
- 1576US10180630B2Illumination system for a lithographic or inspection apparatusASML NETHERLANDS BV·Filed 2017·Granted Jan 15, 2019·2 cites·20 claims
- 1676US6809994B2Method for controlling radiation power of domain expansion type magneto-optical recording mediumKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Oct 26, 2004·9 cites·14 claims
- 1774US11875966B2Method and apparatus for inspectionASML NETHERLANDS BV·Filed 2021·Granted Jan 16, 2024·0 cites·22 claims
- 1873US8405300B2Transparent OLED device with high intensityVAN BOMMEL TIES·Filed 2010·Granted Mar 26, 2013·2 cites·10 claims
- 1972US6700837B2Method and apparatus for reading from a domain expansion recording medium by using an external magnetic field to form and remove the expanded domainKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Mar 2, 2004·8 cites·6 claims
- 2071US9379356B2Sealed thin-film device as well as method of repairing, system for repairing and computer program productTNO·Filed 2012·Granted Jun 28, 2016·2 cites·5 claims
- 2170US7352659B2Method and apparatus for phase and/or copy window control use with a domain expansion recording medium and record carrierKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Apr 1, 2008·6 cites·19 claims
- 2268US8749166B2Method and device for driving an OLED deviceVERSCHUREN COEN ADRIANUS·Filed 2010·Granted Jun 10, 2014·1 cites·11 claims
- 2367US7613083B2Optical scanning deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Nov 3, 2009·1 cites·17 claims
- 2462US9070902B2Patterned LED device, method of generating a patterning, system and method of calibrating the systemVERSCHUREN COEN A·Filed 2009·Granted Jun 30, 2015·2 cites·15 claims
- 2561US10555407B2Metrology methods, radiation source, metrology apparatus and device manufacturing methodASML NETHERLANDS BV·Filed 2019·Granted Feb 4, 2020·0 cites·23 claims
- 2661US9748522B2Illumination system comprising beam shaping elementVERSCHUREN COEN ADRIANUS·Filed 2010·Granted Aug 29, 2017·1 cites·9 claims
- 2761US8258454B2Luminaire and a method for controlling a luminaireVERSCHUREN COEN ADRIANUS·Filed 2008·Granted Sep 4, 2012·1 cites·13 claims
- 2861US2008259743A1Method and apparatus for phase and/or copy window control for use with a domain expansion recording medium and record carrierKONINKL PHILIPS ELECTRONICS NV·Filed 2008·Application pending·0 cites
- 2960US7027365B2Magneto-optical recording for improved domain expansion readingKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Apr 11, 2006·4 cites·11 claims
- 3060US2024233305A1Aligning a distorted imageASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 3158US11402374B2Method of detecting label particlesSIEMENS HEALTHINEERS NEDERLAND B V·Filed 2015·Granted Aug 2, 2022·0 cites·4 claims
- 3258US11094502B2Method and apparatus for inspectionASML NETHERLANDS BV·Filed 2016·Granted Aug 17, 2021·0 cites·20 claims
- 3358US8605234B2Light guide, patterned light emitting diode device, illumination system and method of generating the light guide or patterned light emitting diode deviceVERSCHUREN COEN A·Filed 2009·Granted Dec 10, 2013·2 cites·16 claims
- 3456US8901810B2Transparent OLED device with high intensityKONINKL PHILIPS ELECTRONICS NV·Filed 2013·Granted Dec 2, 2014·0 cites·20 claims
- 3555US11243199B2Carrier for detecting label particlesSIEMENS HEALTHINEERS NEDERLAND B V·Filed 2015·Granted Feb 8, 2022·0 cites·15 claims
- 3655US2024369944A1Method for determining a stochastic metric relating to a lithographic processASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 3754US2024004313A1Method and apparatus for imaging nonstationary objectASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 3854US2023267711A1Apparatus and method for selecting informative patterns for training machine learning modelsASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 3953US8680762B2Device and method for lightingVERSCHUREN COEN A·Filed 2009·Granted Mar 25, 2014·0 cites·17 claims
- 4051US7224644B2Head arrangement for domain expansion magnetic amplifying magneto-optical systemKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted May 29, 2007·1 cites·16 claims
- 4151US2010197038A1Microelectronic sensor device for optical examinations with total internal reflectionKONINKL PHILIPS ELECTRONICS NV·Filed 2008·Application pending·0 cites
- 4251US2024085379A1Methods and apparatus for acoustic metrologyASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 4351US2025067768A1Element of an afm toolASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 4450US2009257332A1optical disc reading apparatus and method thereforeKONINKL PHILIPS ELECTRONICS NV·Filed 2007·Application pending·0 cites
- 4550US2009154319A1Optical disc reading apparatus and method thereforeKONINKL PHILIPS ELECTRONICS NV·Filed 2007·Application pending·0 cites
- 4650US2009141597A1Near field optical recording device and a method of operating a near field optical recording deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2007·Application pending·0 cites
- 4750US2010187450A1Microelectronic sensor device with light source and light detectorKONINKL PHILIPS ELECTRONICS NV·Filed 2008·Application pending·0 cites
- 4850US2022335290A1Method for increasing certainty in parameterized model predictionsASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 4950US2011188030A1Microelectronic sensor device for optical examinations in a sample mediumKONINKL PHILIPS ELECTRONICS NV·Filed 2008·Application pending·0 cites
- 5049US8618529B2Device, method and system for lightingVERSCHUREN COEN ADRIANUS·Filed 2008·Granted Dec 31, 2013·0 cites·21 claims
Showing the top 50 of 94 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →