Inventor · disambiguated record
Tetsushi Tanizaki
Also filed as: TANIZAKI TETSUSHI
27 granted patents·1 pending application·700 citations·filing 1992–2007
97Inventor score
Top patents by PatentIndex Score
28 records- 0193US6064621AMulti-bank clock synchronous type semiconductor memory device having improved memory array and power supply arrangementMITSUBISHI ELECTRIC CORP·Filed 1998·Granted May 16, 2000·103 cites·19 claims
- 0291US7007215B2Test circuit capable of testing embedded memory with reliabilityRENESAS TECH CORP·Filed 2002·Granted Feb 28, 2006·46 cites·12 claims
- 0387US5914907ASemiconductor memory device capable of increasing chip yields while maintaining rapid operationMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jun 22, 1999·69 cites·8 claims
- 0485US6496429B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 17, 2002·39 cites·12 claims
- 0585US6295238B1Semiconductor memory device having a circuit for fast operationMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 25, 2001·29 cites·8 claims
- 0682US6962827B1Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2003·Granted Nov 8, 2005·29 cites·10 claims
- 0782US5349562ADynamic random access memory device suitable for shortening time required for testing self-refresh functionMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Sep 20, 1994·48 cites·11 claims
- 0880US6993696B1Semiconductor memory device with built-in self test circuit operating at high rateRYODEN SEMICONDUCTOR SYST ENG·Filed 2000·Granted Jan 31, 2006·30 cites·2 claims
- 0977US6072743AHigh speed operable semiconductor memory device with memory blocks arranged about the centerMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jun 6, 2000·35 cites·7 claims
- 1077US6038186ASemiconductor memory device that can have power consumption reduced during self refresh modeMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 14, 2000·41 cites·10 claims
- 1174US6782498B2Semiconductor memory device allowing mounting of built-in self test circuit without addition of interface specificationRENESAS TECH CORP·Filed 2001·Granted Aug 24, 2004·22 cites·16 claims
- 1273US6215720B1High speed operable semiconductor memory device with memory blocks arranged about the centerMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Apr 10, 2001·18 cites·7 claims
- 1373US5896328ASemiconductor memory device allowing writing of desired data to a storage node of a defective memory cellMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Apr 20, 1999·34 cites·12 claims
- 1469US6327198B1Semiconductor memory device having a test mode setting circuitMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Dec 4, 2001·17 cites·14 claims
- 1568US6762967B2Semiconductor memory device having a circuit for fast operationRENESAS TECH CORP·Filed 2003·Granted Jul 13, 2004·12 cites·2 claims
- 1668US6272034B1Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Aug 7, 2001·16 cites·4 claims
- 1766US7505352B2Parallel operational processing deviceRENESAS TECH CORP·Filed 2007·Granted Mar 17, 2009·4 cites·6 claims
- 1866US6614713B2Semiconductor memory device having a circuit for fast operationMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 2, 2003·11 cites·4 claims
- 1961US5386387ASemiconductor memory device including additional memory cell block having irregular memory cell arrangementMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Jan 31, 1995·20 cites·5 claims
- 2058US5297102ASemiconductor memory device storing data and parity bitMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Mar 22, 1994·18 cites·15 claims
- 2155US7032141B2Semiconductor device including test-facilitating circuit using built-in self test circuitRENESAS TECH CORP·Filed 2002·Granted Apr 18, 2006·8 cites·7 claims
- 2255US6335645B1Semiconductor integrated circuit having built-in self-test circuitMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jan 1, 2002·10 cites·7 claims
- 2355US5909046ASemiconductor integrated circuit device having stable input protection circuitMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jun 1, 1999·19 cites·20 claims
- 2447US6704229B2Semiconductor test circuit for testing a semiconductor memory device having a write mask functionRENESAS TECH CORP·Filed 2002·Granted Mar 9, 2004·5 cites·10 claims
- 2545US6779139B2Circuit for reducing test time and semiconductor memory device including the circuitRENESAS TECH CORP·Filed 2001·Granted Aug 17, 2004·4 cites·25 claims
- 2644US6337506B2Semiconductor memory device capable of performing stable operation for noise while preventing increase in chip areaMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 8, 2002·11 cites·14 claims
- 2740US6288956B1Semiconductor device having test functionMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 11, 2001·2 cites·11 claims
- 2833US2004250165A1Semiconductor memory device permitting boundary scan testRENESAS TECH CORP·Filed 2003·Application pending·0 cites
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