Inventor · disambiguated record
Chih-Jie Lee
Also filed as: LEE CHIH-JIE
10 granted patents·1 pending application·20 citations·filing 2017–2024
83Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD11
Top patents by PatentIndex Score
11 records- 0197US11243472B2Optical proximity correction and photomasksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 8, 2022·4 cites·20 claims
- 0297US10678142B2Optical proximity correction and photomasksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 9, 2020·13 cites·20 claims
- 0395US11789370B2Optical proximity correction and photomasksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Oct 17, 2023·2 cites·20 claims
- 0481US12265334B2Optical proximity correction and photomasksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Apr 1, 2025·0 cites·20 claims
- 0580US12085867B2Lithography process monitoring methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 10, 2024·0 cites·20 claims
- 0677US11782352B2Lithography process monitoring methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Oct 10, 2023·0 cites·20 claims
- 0776US2024385545A1Lithography process monitoring methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0875US10488766B2Lithography system having invisible pellicle over maskTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Nov 26, 2019·1 cites·20 claims
- 0972US11467509B2Lithography process monitoring methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Oct 11, 2022·0 cites·20 claims
- 1063US10962892B2Lithography process monitoring methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Mar 30, 2021·0 cites·20 claims
- 1145US10418245B2Method for integrated circuit manufacturing with directed self-assembly (DSA)TAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Sep 17, 2019·0 cites·20 claims
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