Inventor
KHAKIFIROOZ ALI
US759 patents
⚠️ This page may combine multiple inventors who share the name “KHAKIFIROOZ ALI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
40 patentsUS8969934B1Mar 3, 2015
Gate-all-around nanowire MOSFET and method of formation
IBM326 citations99
US9659963B2May 23, 2017
Contact formation to 3D monolithic stacked FinFETs
IBM79 citations98
US9455331B1Sep 27, 2016
Method and structure of forming controllable unmerged epitaxial material
IBM66 citations98
US9356027B1May 31, 2016
Dual work function integration for stacked FinFET
IBM40 citations98
US9312383B1Apr 12, 2016
Self-aligned contacts for vertical field effect transistors
IBM55 citations98
US9293459B1Mar 22, 2016
Method and structure for improving finFET with epitaxy source/drain
IBM54 citations98
US9219154B1Dec 22, 2015
Method of fabricating electrostatically enhanced fins and stacked nanowire field effect transistors
IBM46 citations98
US9196479B1Nov 24, 2015
Method of co-integration of strained silicon and strained germanium in semiconductor devices including fin structures
IBM40 citations98
US8900951B1Dec 2, 2014
Gate-all-around nanowire MOSFET and method of formation
IBM38 citations98
US8822320B2Sep 2, 2014
Dense finFET SRAM
IBM38 citations98
US8796093B1Aug 5, 2014
Doping of FinFET structures
IBM71 citations98
US7993999B2Aug 9, 2011
High-K/metal gate CMOS finFET with improved pFET threshold voltage
IBM111 citations98
US9659942B1May 23, 2017
Selective epitaxy growth for semiconductor devices with fin field-effect transistors (FinFET)
IBM22 citations94
US9472628B2Oct 18, 2016
Heterogeneous source drain region and extension region
IBM31 citations94
US9437502B1Sep 6, 2016
Method to form stacked germanium nanowires and stacked III-V nanowires
IBM29 citations94
US9318553B1Apr 19, 2016
Nanowire device with improved epitaxy
IBM25 citations94
US9257527B2Feb 9, 2016
Nanowire transistor structures with merged source/drain regions using auxiliary pillars
IBM36 citations94
US9093533B2Jul 28, 2015
FinFET structures having silicon germanium and silicon channels
IBM33 citations94
US8951870B2Feb 10, 2015
Forming strained and relaxed silicon and silicon germanium fins on the same wafer
IBM39 citations94
US8653599B1Feb 18, 2014
Strained SiGe nanowire having (111)-oriented sidewalls
IBM39 citations94
US9721885B2Aug 1, 2017
Electrical fuse and/or resistor structures
IBM7 citations93
US9716064B2Jul 25, 2017
Electrical fuse and/or resistor structures
IBM7 citations93
US9660050B1May 23, 2017
Replacement low-k spacer
IBM14 citations93
US9627270B2Apr 18, 2017
Dual work function integration for stacked FinFET
IBM15 citations93
US9455250B1Sep 27, 2016
Distributed decoupling capacitor
IBM12 citations93
US9431296B2Aug 30, 2016
Structure and method to form liner silicide with improved contact resistance and reliablity
IBM22 citations93
US9397094B2Jul 19, 2016
Semiconductor structure with an L-shaped bottom plate
IBM13 citations93
US9379204B2Jun 28, 2016
Lattice matched aspect ratio trapping to reduce defects in III-V layer directly grown on silicon
IBM16 citations93
US9362285B2Jun 7, 2016
Structure and method to increase contact area in unmerged EPI integration for CMOS FinFETs
IBM23 citations93
US9269627B1Feb 23, 2016
Fin cut on SIT level
IBM16 citations93
US9064698B1Jun 23, 2015
Thin-film gallium nitride structures grown on graphene
IBM25 citations93
US9040363B2May 26, 2015
FinFET with reduced capacitance
IBM12 citations93
US8993399B2Mar 31, 2015
FinFET structures having silicon germanium and silicon fins
IBM25 citations93
US8987069B1Mar 24, 2015
Semiconductor substrate with multiple SiGe regions having different germanium concentrations by a single epitaxy process
IBM24 citations93
US8987790B2Mar 24, 2015
Fin isolation in multi-gate field effect transistors
IBM22 citations93
US8987823B2Mar 24, 2015
Method and structure for forming a localized SOI finFET
IBM20 citations93
US8981493B2Mar 17, 2015
FinFET and method of fabrication
IBM17 citations93
US8946007B2Feb 3, 2015
Inverted thin channel mosfet with self-aligned expanded source/drain
IBM17 citations93
US8895381B1Nov 25, 2014
Method of co-integration of strained-Si and relaxed Si or strained SiGe FETs on insulator with planar and non-planar architectures
IBM25 citations93
US8878311B2Nov 4, 2014
Integrated circuit having raised source drains devices with reduced silicide contact resistance and methods to fabricate same
IBM20 citations93
GLOBALFOUNDRIES INC
4 patentsUS8703557B1Apr 22, 2014
Methods of removing dummy fin structures when forming finFET devices
GLOBALFOUNDRIES INC63 citations98
US9349658B1May 24, 2016
Methods of forming fin isolation regions on finFET semiconductor devices using an oxidation-blocking layer of material
GLOBALFOUNDRIES INC31 citations94
US9064890B1Jun 23, 2015
Methods of forming isolation material on FinFET semiconductor devices and the resulting devices
GLOBALFOUNDRIES INC25 citations93
US8921191B2Dec 30, 2014
Integrated circuits including FINFET devices with lower contact resistance and reduced parasitic capacitance and methods for fabricating the same
GLOBALFOUNDRIES INC30 citations93
INTEL CORP
2 patentsBEDELL STEPHEN W
1 patentXIE RUILONG
1 patentADAM THOMAS N
1 patentBASKER VEERARAGHAVAN S
1 patentShowing the top 50 of 759 patents by PatentIndex Score.