Inventor · disambiguated record
Hideyuki Oshima
Also filed as: OSHIMA HIDEYUKI
7 granted patents·47 citations·filing 2003–2020
83Inventor score
Files withADVANTEST CORP7
Top patents by PatentIndex Score
7 records- 0178US11275104B2Test apparatusADVANTEST CORP·Filed 2020·Granted Mar 15, 2022·2 cites·15 claims
- 0278US7330045B2Semiconductor test apparatusADVANTEST CORP·Filed 2007·Granted Feb 12, 2008·6 cites·4 claims
- 0367US7187192B2Semiconductor test device having clock recovery circuitADVANTEST CORP·Filed 2003·Granted Mar 6, 2007·13 cites·12 claims
- 0466US6956395B2Tester for testing an electronic device using oscillator and frequency dividerADVANTEST CORP·Filed 2004·Granted Oct 18, 2005·13 cites·12 claims
- 0560US7196534B2Semiconductor test instrumentADVANTEST CORP·Filed 2003·Granted Mar 27, 2007·7 cites·9 claims
- 0651US7078889B2Semiconductor test apparatus for testing semiconductor device that produces output data by its internal clock timingADVANTEST CORP·Filed 2003·Granted Jul 18, 2006·6 cites·10 claims
- 0734US7444576B2Target value search circuit, taget value search method, and semiconductor test device using the sameADVANTEST CORP·Filed 2003·Granted Oct 28, 2008·0 cites·4 claims
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