Inventor · disambiguated record
Hideko Oodaira
Also filed as: OODAIRA HIDEKO
26 granted patents·360 citations·filing 1994–2012
97Inventor score
Top patents by PatentIndex Score
26 records- 0197US6353242B1Nonvolatile semiconductor memoryTOSHIBA KK·Filed 1999·Granted Mar 5, 2002·127 cites·22 claims
- 0295US6512253B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2001·Granted Jan 28, 2003·45 cites·20 claims
- 0388US5734286ADriving device of charge pump circuit and driving pulse generation method thereofTOSHIBA KK·Filed 1994·Granted Mar 31, 1998·53 cites·29 claims
- 0486US7893477B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2007·Granted Feb 22, 2011·6 cites·20 claims
- 0585US7425739B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2005·Granted Sep 16, 2008·6 cites·12 claims
- 0685US6974979B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2002·Granted Dec 13, 2005·17 cites·14 claims
- 0778US7332762B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2006·Granted Feb 19, 2008·3 cites·15 claims
- 0878US6240012B1Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldTOSHIBA KK·Filed 1999·Granted May 29, 2001·22 cites·40 claims
- 0977US7359228B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldTOSHIBA KK·Filed 2006·Granted Apr 15, 2008·5 cites·49 claims
- 1074US8084802B2Nonvolatile semiconductor memoryWATANABE HIROSHI·Filed 2011·Granted Dec 27, 2011·2 cites·44 claims
- 1164US7787277B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldTOSHIBA KK·Filed 2008·Granted Aug 31, 2010·2 cites·49 claims
- 1264US6611447B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldTOSHIBA KK·Filed 2002·Granted Aug 26, 2003·6 cites·40 claims
- 1363US6424588B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldTOSHIBA KK·Filed 2000·Granted Jul 23, 2002·6 cites·4 claims
- 1463US5477495ANonvolatile semiconductor memory apparatusTOSHIBA KK·Filed 1994·Granted Dec 19, 1995·22 cites·22 claims
- 1557US7002845B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldTOSHIBA KK·Filed 2004·Granted Feb 21, 2006·4 cites·40 claims
- 1657US5812455ASemiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit deviceTOSHIBA KK·Filed 1996·Granted Sep 22, 1998·11 cites·19 claims
- 1756US6836444B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldTOSHIBA KK·Filed 2003·Granted Dec 28, 2004·4 cites·62 claims
- 1854US5943282ASemiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit deviceTOSHIBA KK·Filed 1998·Granted Aug 24, 1999·9 cites·12 claims
- 1953US8350309B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2011·Granted Jan 8, 2013·1 cites·44 claims
- 2051US8665661B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldNAKAMURA HIROSHI·Filed 2012·Granted Mar 4, 2014·0 cites·20 claims
- 2150US6487118B2Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit deviceTOSHIBA KK·Filed 2000·Granted Nov 26, 2002·4 cites·15 claims
- 2249US8259494B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldNAKAMURA HIROSHI·Filed 2010·Granted Sep 4, 2012·0 cites·90 claims
- 2349US8248849B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldNAKAMURA HIROSHI·Filed 2010·Granted Aug 21, 2012·0 cites·82 claims
- 2447US6335894B1Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit deviceTOSHIBA KK·Filed 2000·Granted Jan 1, 2002·3 cites·14 claims
- 2544US7151685B2Semiconductor memory device capable of realizing a chip with high operation reliability and high yieldTOSHIBA KK·Filed 2006·Granted Dec 19, 2006·0 cites·31 claims
- 2635US6172930B1Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit deviceTOSHIBA KK·Filed 1999·Granted Jan 9, 2001·2 cites·7 claims
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