Inventor · disambiguated record
David K. Mcelfresh
Also filed as: MCELFRESH DAVID · MCELFRESH DAVID K · MCELFRESH DAVID KEITH
57 granted patents·9 pending applications·956 citations·filing 1994–2022
98Inventor score
Files withSUN MICROSYSTEMS INC18ORACLE AMERICA INC12HEWLETT PACKARD DEVELOPMENT CO8MCELFRESH DAVID K5BOUGAEV ANTON A4
Top patents by PatentIndex Score
66 records- 0198US6557976B2Electrical circuit for wide-array inkjet printhead assemblyHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted May 6, 2003·317 cites·14 claims
- 0295US8055594B2Proactive detection of metal whiskers in computer systemsORACLE AMERICA INC·Filed 2007·Granted Nov 8, 2011·32 cites·29 claims
- 0394US8275738B2Radio frequency microscope for amplifying and analyzing electromagnetic signals by positioning the monitored system at a locus of an ellipsoidal surfaceGROSS KENNY C·Filed 2009·Granted Sep 25, 2012·28 cites·21 claims
- 0493US7577542B2Method and apparatus for dynamically adjusting the resolution of telemetry signalsSUN MICROSYSTEMS INC·Filed 2007·Granted Aug 18, 2009·28 cites·21 claims
- 0592US6719398B1Inkjet printing with air movement systemHEWLETT PACKARD DEVELOPMENT CO·Filed 2000·Granted Apr 13, 2004·41 cites·18 claims
- 0691US8543346B2Near-isotropic antenna for monitoring electromagnetic signalsGROSS KENNY C·Filed 2009·Granted Sep 24, 2013·26 cites·20 claims
- 0791US6997540B2Substrate for fluid ejection devicesHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Feb 14, 2006·36 cites·32 claims
- 0889US7162393B1Detecting degradation of components during reliability-evaluation studiesSUN MICROSYSTEMS INC·Filed 2005·Granted Jan 9, 2007·23 cites·21 claims
- 0989US5514627AMethod and apparatus for improving the performance of light emitting diodesHEWLETT PACKARD CO·Filed 1994·Granted May 7, 1996·150 cites·7 claims
- 1088US7832818B1Inkjet pen with proximity interconnectORACLE AMERICA INC·Filed 2005·Granted Nov 16, 2010·10 cites·8 claims
- 1188US7330325B2Proactive fault monitoring of disk drives through phase-sensitive surveillanceSUN MICROSYSTEMS INC·Filed 2006·Granted Feb 12, 2008·8 cites·27 claims
- 1287US7861593B2Rotational vibration measurements in computer systemsORACLE AMERICA INC·Filed 2008·Granted Jan 4, 2011·12 cites·20 claims
- 1386US7184932B1Reliability prediction for complex componentsSUN MICROSYSTEMS INC·Filed 2006·Granted Feb 27, 2007·17 cites·20 claims
- 1485US6705705B2Substrate for fluid ejection devicesHEWLETT PACKARD DEVELOPMENT CO·Filed 2002·Granted Mar 16, 2004·23 cites·48 claims
- 1582US8190276B2Method and apparatus for controlling temperature variations in a computer systemLEWIS ANDREW J·Filed 2008·Granted May 29, 2012·12 cites·19 claims
- 1682US7870440B2Method and apparatus for detecting multiple anomalies in a cluster of componentsORACLE AMERICA INC·Filed 2008·Granted Jan 11, 2011·12 cites·23 claims
- 1782US6575559B2Joining of different materials of carrier for fluid ejection devicesHEWLETT PACKARD DEVELOPMENT CO·Filed 2001·Granted Jun 10, 2003·23 cites·49 claims
- 1882US6409307B1Coplanar mounting of printhead dies for wide-array inkjet printhead assemblyHEWLETT PACKARD CO·Filed 2001·Granted Jun 25, 2002·23 cites·35 claims
- 1981US7216062B1Characterizing degradation of components during reliability-evaluation studiesSUN MICROSYSTEMS INC·Filed 2006·Granted May 8, 2007·11 cites·20 claims
- 2079US8340923B2Predicting remaining useful life for a computer system using a stress-based prediction techniqueWOOD ALAN PAUL·Filed 2010·Granted Dec 25, 2012·8 cites·18 claims
- 2179US7283919B2Determining the quality and reliability of a component by monitoring dynamic variablesSUN MICROSYSTEMS INC·Filed 2006·Granted Oct 16, 2007·9 cites·15 claims
- 2279US6520624B1Substrate with fluid passage supportsHEWLETT PACKARD CO·Filed 2002·Granted Feb 18, 2003·24 cites·15 claims
- 2378US6886905B2Inkjet printing with air movement systemHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted May 3, 2005·18 cites·46 claims
- 2477US11586195B2Estimating the remaining useful life for cooling fans based on a wear-out index analysisORACLE INT CORP·Filed 2022·Granted Feb 21, 2023·0 cites·20 claims
- 2576US7353431B2Method and apparatus for proactive fault monitoring in interconnectsSUN MICROSYSTEMS INC·Filed 2006·Granted Apr 1, 2008·8 cites·18 claims
- 2674US8207752B2Fault-tolerant multi-chip moduleRAJ KANNAN·Filed 2010·Granted Jun 26, 2012·4 cites·20 claims
- 2773US7920974B2Generating a vibration profile for a rotating cooling device in a computer systemORACLE AMERICA INC·Filed 2009·Granted Apr 5, 2011·6 cites·20 claims
- 2869US7813119B2Method and apparatus for reducing coupled hard disk drive vibrationORACLE AMERICA INC·Filed 2007·Granted Oct 12, 2010·1 cites·11 claims
- 2969US7668696B2Method and apparatus for monitoring the health of a computer systemSUN MICROSYSTEMS INC·Filed 2007·Granted Feb 23, 2010·4 cites·19 claims
- 3068US8204716B2System and method for characterizing vibration of a rack structureGROSS KENNY C·Filed 2009·Granted Jun 19, 2012·3 cites·8 claims
- 3167US7890278B2Characterizing the response of a device in a computer system to vibration over a frequency rangeORACLE AMERICA INC·Filed 2008·Granted Feb 15, 2011·4 cites·21 claims
- 3265US7680624B2Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signalsSUN MICROSYSTEMS INC·Filed 2007·Granted Mar 16, 2010·3 cites·15 claims
- 3364US9557301B2Methods for characterizing vibration of a rack structureORACLE AMERICA INC·Filed 2013·Granted Jan 31, 2017·0 cites·4 claims
- 3464US8666912B2Mechanical shock feature extraction for overstress event registrationBOUGAEV ANTON A·Filed 2010·Granted Mar 4, 2014·1 cites·19 claims
- 3562US6843552B2Electrical circuit for printhead assemblyHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Jan 18, 2005·7 cites·32 claims
- 3660US11307568B2Estimating the remaining useful life for cooling fans based on a wear-out index analysisORACLE INT CORP·Filed 2019·Granted Apr 19, 2022·0 cites·17 claims
- 3759US7869905B2Method and apparatus for using a heater to control the temperature of a power supply in a computer systemORACLE AMERICA INC·Filed 2008·Granted Jan 11, 2011·1 cites·22 claims
- 3858US7800385B2Apparatus and method for testing electrical interconnectsORACLE AMERICA INC·Filed 2008·Granted Sep 21, 2010·3 cites·20 claims
- 3958US6880246B2Method of forming substrate with fluid passage supportsHEWLETT PACKARD DEVELOPMENT CO·Filed 2002·Granted Apr 19, 2005·7 cites·21 claims
- 4057US8213281B2Characterizing the performance of a disk drive across a range of vibration frequenciesMCELFRESH DAVID K·Filed 2008·Granted Jul 3, 2012·0 cites·19 claims
- 4157US7466404B1Technique for diagnosing and screening optical interconnect light sourcesSUN MICROSYSTEMS INC·Filed 2005·Granted Dec 16, 2008·3 cites·24 claims
- 4254US7672808B2Determining a center of rotation for a component in a computer systemSUN MICROSYSTEMS INC·Filed 2008·Granted Mar 2, 2010·1 cites·17 claims
- 4353US8635048B2Methods for characterizing vibration of a rack structureGROSS KENNY C·Filed 2012·Granted Jan 21, 2014·0 cites·9 claims
- 4453US8239623B2Scheduling read operations during drive reconstruction in an array of redundant disk drivesBOUGAEV ANTON A·Filed 2008·Granted Aug 7, 2012·0 cites·18 claims
- 4553US7982468B2Apparatus and method for testing electrical interconnects with switchesORACLE AMERICA INC·Filed 2008·Granted Jul 19, 2011·2 cites·17 claims
- 4653US2010020438A1Multi-dimensional hard disk drive vibration mitigationSUN MICROSYSTEMS INC·Filed 2008·Application pending·0 cites
- 4752US8601212B2Scheduling read operations during drive reconstruction in an array of redundant disk drivesBOUGAEV ANTON A·Filed 2012·Granted Dec 3, 2013·0 cites·6 claims
- 4851US8140282B2Determining a total length for conductive whiskers in computer systemsMCELFRESH DAVID K·Filed 2008·Granted Mar 20, 2012·1 cites·20 claims
- 4950US8140277B2Enhanced characterization of electrical connection degradationMCELFRESH DAVID K·Filed 2009·Granted Mar 20, 2012·1 cites·17 claims
- 5049US8798944B2Estimating ball-grid-array longevity in a computer systemURMANOV ALEKSEY M·Filed 2009·Granted Aug 5, 2014·0 cites·21 claims
Showing the top 50 of 66 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →