Inventor · disambiguated record
John G. Pellerin
Also filed as: PELLERIN JOHN · PELLERIN JOHN G
21 granted patents·1 pending application·571 citations·filing 1998–2013
96Inventor score
Top patents by PatentIndex Score
22 records- 0196US6228758B1Method of making dual damascene conductive interconnections and integrated circuit device comprising sameADVANCED MICRO DEVICES INC·Filed 1998·Granted May 8, 2001·241 cites·12 claims
- 0290US7723192B2Integrated circuit long and short channel metal gate devices and method of manufactureADVANCED MICRO DEVICES INC·Filed 2008·Granted May 25, 2010·16 cites·19 claims
- 0389US7091118B1Replacement metal gate transistor with metal-rich silicon layer and method for making the sameIBM·Filed 2004·Granted Aug 15, 2006·49 cites·19 claims
- 0489US6713357B1Method to reduce parasitic capacitance of MOS transistorsADVANCED MICRO DEVICES INC·Filed 2001·Granted Mar 30, 2004·65 cites·16 claims
- 0585US8053849B2Replacement metal gate transistors with reduced gate oxide leakageADVANCED MICRO DEVICES INC·Filed 2005·Granted Nov 8, 2011·9 cites·17 claims
- 0683US7902599B2Integrated circuit having long and short channel metal gate devices and method of manufactureADVANCED MICRO DEVICES INC·Filed 2009·Granted Mar 8, 2011·8 cites·19 claims
- 0783US7544572B2Multi-operational mode transistor with multiple-channel device structureADVANCED MICRO DEVICES INC·Filed 2005·Granted Jun 9, 2009·10 cites·26 claims
- 0878US6764917B1SOI device with different silicon thicknessesADVANCED MICRO DEVICES INC·Filed 2001·Granted Jul 20, 2004·23 cites·15 claims
- 0975US5986344AAnti-reflective coating layer for semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 16, 1999·44 cites·4 claims
- 1072US7091106B2Method of reducing STI divot formation during semiconductor device fabricationADVANCED MICRO DEVICES INC·Filed 2004·Granted Aug 15, 2006·18 cites·7 claims
- 1169US6580122B1Transistor device having an enhanced width dimension and a method of making sameADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 17, 2003·7 cites·34 claims
- 1267US6317642B1Apparatus and methods for uniform scan dispensing of spin-on materialsADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 13, 2001·32 cites·22 claims
- 1364US7253484B2Low-power multiple-channel fully depleted quantum well CMOSFETsADVANCED MICRO DEVICES INC·Filed 2006·Granted Aug 7, 2007·2 cites·12 claims
- 1464US6780776B1Nitride offset spacer to minimize silicon recess by using poly reoxidation layer as etch stop layerADVANCED MICRO DEVICES INC·Filed 2001·Granted Aug 24, 2004·9 cites·15 claims
- 1559US6399493B1Method of silicide formation by silicon pretreatmentADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 4, 2002·8 cites·22 claims
- 1657US7223698B1Method of forming a semiconductor arrangement with reduced field-to active step heightADVANCED MICRO DEVICES INC·Filed 2005·Granted May 29, 2007·2 cites·16 claims
- 1756US6406964B1Method of controlling junction recesses in a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 18, 2002·5 cites·40 claims
- 1855US7074657B2Low-power multiple-channel fully depleted quantum well CMOSFETsADVANCED MICRO DEVICES INC·Filed 2003·Granted Jul 11, 2006·5 cites·6 claims
- 1955US6191030B1Anti-reflective coating layer for semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 20, 2001·18 cites·7 claims
- 2054US8753943B2Replacement metal gate transistors with reduced gate oxide leakageADVANCED MICRO DEVICES INC·Filed 2013·Granted Jun 17, 2014·0 cites·10 claims
- 2151US8445975B2Replacement metal gate transistors with reduced gate oxide leakagePAN JAMES·Filed 2011·Granted May 21, 2013·0 cites·9 claims
- 2234US2002137268A1Method of forming silicide contacts and device incorporation sameFiled 2001·Application pending·0 cites
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