Inventor · disambiguated record
Sani R. Nassif
Also filed as: NASSIF SANI · NASSIF SANI R · NASSIF SANI RICHARD
76 granted patents·11 pending applications·1,042 citations·filing 1997–2019
99Inventor score
Top patents by PatentIndex Score
87 records- 0198US8214190B2Methodology for correlated memory fail estimationsJOSHI RAJIV V·Filed 2009·Granted Jul 3, 2012·107 cites·17 claims
- 0298US7380225B2Method and computer program for efficient cell failure rate estimation in cell arraysIBM·Filed 2006·Granted May 27, 2008·127 cites·9 claims
- 0396US8347240B2Split-layer design for double patterning lithographyIBM·Filed 2010·Granted Jan 1, 2013·26 cites·21 claims
- 0495US8229683B2Test circuit for bias temperature instability recovery measurementsGEBARA FADI H·Filed 2010·Granted Jul 24, 2012·14 cites·8 claims
- 0595US7423446B2Characterization array and method for determining threshold voltage variationIBM·Filed 2006·Granted Sep 9, 2008·23 cites·4 claims
- 0694US9987502B1Radiation therapy treatment planning using regressionIBM·Filed 2016·Granted Jun 5, 2018·32 cites·20 claims
- 0794US7532078B2Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristicsIBM·Filed 2007·Granted May 12, 2009·22 cites·10 claims
- 0894US6842714B1Method for determining the leakage power for an integrated circuitIBM·Filed 2003·Granted Jan 11, 2005·82 cites·22 claims
- 0994US5963043AMethod and apparatus for characterized parasitic capacitance between integrated-circuit interconnectsIBM·Filed 1997·Granted Oct 5, 1999·106 cites·11 claims
- 1093US8434033B2Mask assignment for multiple patterning lithographyABOU GHAIDA RANI S·Filed 2011·Granted Apr 30, 2013·13 cites·20 claims
- 1192US6754092B2Method and apparatus for reducing power consumption for power supplied by a voltage adapterIBM·Filed 2002·Granted Jun 22, 2004·86 cites·21 claims
- 1291US8516403B2Multiple patterning layout decomposition for ease of conflict removalABOU GHAIDA RANI S·Filed 2011·Granted Aug 20, 2013·22 cites·20 claims
- 1391US8321818B2Model-based retargeting of layout patterns for sub-wavelength photolithographyAGARWAL KANAK B·Filed 2009·Granted Nov 27, 2012·13 cites·20 claims
- 1491US7551508B2Energy efficient storage device using per-element selectable power supply voltagesIBM·Filed 2007·Granted Jun 23, 2009·19 cites·14 claims
- 1589US7949482B2Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recoveryIBM·Filed 2008·Granted May 24, 2011·13 cites·15 claims
- 1687US8508212B2Calibration of non-contact current sensorsEL-ESSAWY WAEL·Filed 2011·Granted Aug 13, 2013·6 cites·22 claims
- 1787US8245159B2Gradient based search mechanism for optimizing photolithograph masksLIU YING·Filed 2009·Granted Aug 14, 2012·7 cites·3 claims
- 1887US7818137B2Characterization circuit for fast determination of device capacitance variationIBM·Filed 2009·Granted Oct 19, 2010·12 cites·18 claims
- 1987US7408372B2Method and apparatus for measuring device mismatchesIBM·Filed 2006·Granted Aug 5, 2008·13 cites·6 claims
- 2086US7827018B2Method and computer program for selecting circuit repairs using redundant elements with consideration of aging effectsIBM·Filed 2007·Granted Nov 2, 2010·18 cites·20 claims
- 2186US7137080B2Method for determining and using leakage current sensitivities to optimize the design of an integrated circuitIBM·Filed 2003·Granted Nov 14, 2006·42 cites·20 claims
- 2285US9348680B2Statistical design with importance sampling reuseIBM·Filed 2014·Granted May 24, 2016·5 cites·20 claims
- 2385US6898769B2Decoupling capacitor sizing and placementIBM·Filed 2002·Granted May 24, 2005·41 cites·12 claims
- 2484US8676516B2Test circuit for bias temperature instability recovery measurementsGEBARA FADI H·Filed 2012·Granted Mar 18, 2014·4 cites·7 claims
- 2584US7733720B2Method and system for determining element voltage selection control values for a storage deviceIBM·Filed 2007·Granted Jun 8, 2010·15 cites·24 claims
- 2683US9999788B2Fast and accurate proton therapy dose calculationsIBM·Filed 2015·Granted Jun 19, 2018·8 cites·25 claims
- 2783US7995418B2Method and computer program for controlling a storage device having per-element selectable power supply voltagesIBM·Filed 2009·Granted Aug 9, 2011·10 cites·20 claims
- 2879US7550987B2Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocksIBM·Filed 2007·Granted Jun 23, 2009·10 cites·20 claims
- 2979US7171333B2On-wafer method and apparatus for pre-processing measurements of process and environment-dependent circuit performance variables for statistical analysisIBM·Filed 2005·Granted Jan 30, 2007·8 cites·14 claims
- 3078US8539421B2Layout-specific classification and prioritization of recommended rules violationsAGARWAL KANAK BEHARI·Filed 2011·Granted Sep 17, 2013·5 cites·20 claims
- 3178US8365118B2Broken-spheres methodology for improved failure probability analysis in multi-fail regionsIBM·Filed 2009·Granted Jan 29, 2013·8 cites·25 claims
- 3277US8346528B2Equivalent device statistical modeling for bitline leakage modelingIBM·Filed 2009·Granted Jan 1, 2013·7 cites·20 claims
- 3377US8214777B2On-chip leakage current modeling and measurement circuitJOSHI RAJIV V·Filed 2009·Granted Jul 3, 2012·7 cites·18 claims
- 3477US6769100B2Method and system for power node current waveform modelingIBM·Filed 2002·Granted Jul 27, 2004·24 cites·24 claims
- 3576US7447606B2Method of separating the process variation in threshold voltage and effective channel length by electrical measurementsIBM·Filed 2006·Granted Nov 4, 2008·4 cites·6 claims
- 3675US10737114B2Translating different clinical protocols for particle therapy into a set of constraintsIBM·Filed 2016·Granted Aug 11, 2020·3 cites·20 claims
- 3775US6731129B1Apparatus for measuring capacitance of a semiconductor deviceIBM·Filed 2002·Granted May 4, 2004·18 cites·21 claims
- 3874US8493054B2Calibration of non-contact voltage sensorsEL-ESSAWY WAEL·Filed 2011·Granted Jul 23, 2013·3 cites·11 claims
- 3974US8473879B2On-chip leakage current modeling and measurement circuitJOSHI RAJIV V·Filed 2012·Granted Jun 25, 2013·3 cites·18 claims
- 4073US8742748B2Calibration of non-contact current sensorsIBM·Filed 2013·Granted Jun 3, 2014·2 cites·20 claims
- 4170US6384649B1Apparatus and method for clock skew measurementIBM·Filed 2001·Granted May 7, 2002·16 cites·17 claims
- 4268US7759991B2Scannable virtual rail ring oscillator circuit and system for measuring variations in device characteristicsIBM·Filed 2009·Granted Jul 20, 2010·4 cites·18 claims
- 4367US7560951B2Characterization array circuitIBM·Filed 2008·Granted Jul 14, 2009·3 cites·7 claims
- 4466US11372701B2Statistical design with importance sampling reuseIBM·Filed 2019·Granted Jun 28, 2022·0 cites·20 claims
- 4566US8595664B2Guiding design actions for complex failure modesGATTIKER ANNE ELIZABETH·Filed 2011·Granted Nov 26, 2013·2 cites·13 claims
- 4666US8594989B2Compensating for variations in device characteristics in integrated circuit simulationACAR EMRAH·Filed 2009·Granted Nov 26, 2013·3 cites·20 claims
- 4765US10474774B2Power and performance sorting of microprocessors from first interconnect layer to wafer final testIBM·Filed 2013·Granted Nov 12, 2019·2 cites·18 claims
- 4865US8208339B2Computer program product for controlling a storage device having per-element selectable power supply voltagesJOSHI RAJIV V·Filed 2011·Granted Jun 26, 2012·2 cites·3 claims
- 4965US7885798B2Closed-loop modeling of gate leakage for fast simulatorsIBM·Filed 2007·Granted Feb 8, 2011·3 cites·11 claims
- 5062US7917316B2Test system and computer program for determining threshold voltage variation using a device arrayIBM·Filed 2008·Granted Mar 29, 2011·2 cites·16 claims
Showing the top 50 of 87 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →