Inventor · disambiguated record
Scott Pozzi-Loyola
Also filed as: POZZI-LOYOLA SCOTT
10 granted patents·17 citations·filing 2018–2023
84Inventor score
Files withNANOTRONICS IMAGING INC10
Top patents by PatentIndex Score
10 records- 0194US10545096B1Marco inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2019·Granted Jan 28, 2020·7 cites·6 claims
- 0286US10254214B1Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2018·Granted Apr 9, 2019·6 cites·12 claims
- 0385US10915992B1System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2019·Granted Feb 9, 2021·3 cites·20 claims
- 0476US11656184B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2022·Granted May 23, 2023·0 cites·20 claims
- 0574US11995802B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2023·Granted May 28, 2024·0 cites·20 claims
- 0670US11663703B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2022·Granted May 30, 2023·0 cites·20 claims
- 0770US11341617B2System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2021·Granted May 24, 2022·0 cites·20 claims
- 0870US11125677B2Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2019·Granted Sep 21, 2021·1 cites·12 claims
- 0965US11408829B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2021·Granted Aug 9, 2022·0 cites·20 claims
- 1062US10914686B2Macro inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2020·Granted Feb 9, 2021·0 cites·20 claims
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