Inventor · disambiguated record
Hisayoshi Hanai
Also filed as: HANAI HISAYOSHI
5 granted patents·1 pending application·179 citations·filing 2000–2024
83Inventor score
Files withMITSUBISHI ELECTRIC CORP3RENESAS ELECTRONICS CORP1RENESAS TECH CORP1RYODEN SEMICONDUCTOR SYST ENG1
Top patents by PatentIndex Score
6 records- 0192US7058865B2Apparatus for testing semiconductor integrated circuitRENESAS TECH CORP·Filed 2003·Granted Jun 6, 2006·60 cites·20 claims
- 0289US6492923B1Test system and testing method using memory testerMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 10, 2002·75 cites·10 claims
- 0382US6934648B2Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signalRYODEN SEMICONDUCTOR SYST ENG·Filed 2003·Granted Aug 23, 2005·27 cites·8 claims
- 0470US6661248B2Tester for semiconductor integrated circuitsMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 9, 2003·14 cites·17 claims
- 0561US2025172609A1Probe testing apparatus, probe testing system and probe cardRENESAS ELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0643US6522126B1Semiconductor tester, and method of testing semiconductor using the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 18, 2003·3 cites·6 claims
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