Inventor · disambiguated record
Helga Weiss
Also filed as: WEISS HELGA
11 granted patents·405 citations·filing 1990–1999
93Inventor score
Files withIBM11
Top patents by PatentIndex Score
11 records- 0186US5051379AMethod of producing micromechanical sensors for the AFM/STM profilometry and micromechanical AFM/STM sensor headIBM·Filed 1990·Granted Sep 24, 1991·71 cites·20 claims
- 0284US5116462AMethod of producing micromechanical sensors for the afm/stm profilometryIBM·Filed 1990·Granted May 26, 1992·65 cites·19 claims
- 0380US5578745ACalibration standards for profilometers and methods of producing themIBM·Filed 1995·Granted Nov 26, 1996·63 cites·11 claims
- 0480US5382795AUltrafine silicon tips for AFM/STM profilometryIBM·Filed 1994·Granted Jan 17, 1995·41 cites·13 claims
- 0579US5242541AMethod of producing ultrafine silicon tips for the afm/stm profilometryIBM·Filed 1990·Granted Sep 7, 1993·39 cites·21 claims
- 0671US5960255ACalibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing itIBM·Filed 1997·Granted Sep 28, 1999·29 cites·4 claims
- 0770US5534359ACalibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing itIBM·Filed 1994·Granted Jul 9, 1996·21 cites·8 claims
- 0867US5665905ACalibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing itIBM·Filed 1995·Granted Sep 9, 1997·25 cites·10 claims
- 0966US6218264B1Method of producing a calibration standard for 2-D and 3-D profilometry in the sub-nanometer rangeIBM·Filed 1999·Granted Apr 17, 2001·17 cites·7 claims
- 1060US6091124AMicromechanical sensor for AFM/STM profilometryIBM·Filed 1997·Granted Jul 18, 2000·24 cites·19 claims
- 1153US6088320AMicro-mechanically fabricated read/write head with a strengthening shell on the tip shaftIBM·Filed 1997·Granted Jul 11, 2000·10 cites·11 claims
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