Inventor · disambiguated record
Manoj M. Mhala
Also filed as: MHALA MANOJ · MHALA MANOJ M
11 granted patents·2 pending applications·53 citations·filing 2010–2025
87Inventor score
Top patents by PatentIndex Score
13 records- 0194US8692571B2Apparatus and method for measuring degradation of CMOS VLSI elementsLAI FANG-SHI JORDAN·Filed 2011·Granted Apr 8, 2014·17 cites·20 claims
- 0287US2025327849A1Systems and method to test semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0385US8279102B2Method and apparatus for analog to digital conversionLAI FANG-SHI JORDAN·Filed 2010·Granted Oct 2, 2012·11 cites·20 claims
- 0484US8416105B2ADC calibration apparatusLAI FANG-SHI JORDAN·Filed 2011·Granted Apr 9, 2013·10 cites·20 claims
- 0583US2025350254A1Differential amplifierTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0681US8493259B2Pipeline analog-to-digital converterLAI FANG-SHI JORDAN·Filed 2011·Granted Jul 23, 2013·8 cites·20 claims
- 0780US12405300B2Systems and method to test semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 2, 2025·0 cites·20 claims
- 0874US12301186B2Differential amplifierTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted May 13, 2025·0 cites·20 claims
- 0973US8228221B2Method and apparatus for calibrating sigma-delta modulatorLAI FANG-SHI JORDAN·Filed 2010·Granted Jul 24, 2012·5 cites·20 claims
- 1068US11754616B2Methods and systems to test semiconductor devices based on dynamically updated boundary valuesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 12, 2023·0 cites·20 claims
- 1167US11424726B2Differential amplifierTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 23, 2022·0 cites·8 claims
- 1250US8441384B2Switched-capacitor circuit with low signal degradationLAI FANG-SHI·Filed 2011·Granted May 14, 2013·2 cites·27 claims
- 1348US9881949B2Sensing device, image sensing system and method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 30, 2018·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →