Inventor · disambiguated record
Ki-Sang Kang
Also filed as: KANG KI-SANG
13 granted patents·3 pending applications·121 citations·filing 1999–2009
92Inventor score
Top patents by PatentIndex Score
16 records- 0188US7554349B2Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environmentsSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 30, 2009·16 cites·24 claims
- 0284US7838790B2Multifunctional handler system for electrical testing of semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Nov 23, 2010·11 cites·21 claims
- 0379US7633288B2Method of testing semiconductor devices and handler used for testing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 15, 2009·7 cites·11 claims
- 0469US7153087B2Centering mechanism, centering unit, semiconductor manufacturing apparatus, and centering methodTOKYO ELECTRON LTD·Filed 2003·Granted Dec 26, 2006·12 cites·9 claims
- 0566US7103493B2Memory testing apparatus and methodSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 5, 2006·7 cites·20 claims
- 0663US6625766B1Tester of semiconductor memory device and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Sep 23, 2003·14 cites·15 claims
- 0761US6642729B2Probe card for tester headSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Nov 4, 2003·17 cites·18 claims
- 0861US6445172B1Wafer probing system and method of calibrating wafer probing needle using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Sep 3, 2002·9 cites·16 claims
- 0958US7886206B2Semiconductor memory test device and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Feb 8, 2011·3 cites·10 claims
- 1058US6507801B1Semiconductor device testing systemSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jan 14, 2003·6 cites·20 claims
- 1155US2009206856A1Wafer burn-in system with probe coolingSAMSUNG ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 1250US6288955B1Methods and systems for testing integrated circuit memory devices by overlappiing test result loading and test result analysisSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Sep 11, 2001·16 cites·20 claims
- 1347US7533310B2Semiconductor memory test device and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted May 12, 2009·1 cites·14 claims
- 1445US6972612B2Semiconductor device with malfunction control circuit and controlling method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Dec 6, 2005·2 cites·6 claims
- 1544US2006152239A1Wafer burn-in system with probe coolingNAM JUNG-HYUN·Filed 2006·Application pending·0 cites
- 1639US2006170437A1Probe card for testing a plurality of semiconductor chips and method thereofYOO SANG-KYU·Filed 2006·Application pending·0 cites
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