Inventor · disambiguated record
Teruhisa Yotsuya
Also filed as: YOTSUYA TERUHISA
11 granted patents·1 pending application·321 citations·filing 1987–2005
91Inventor score
Top patents by PatentIndex Score
12 records- 0192US5245671AApparatus for inspecting printed circuit boards and the like, and method of operating sameOMRON TATEISI ELECTRONICS CO·Filed 1989·Granted Sep 14, 1993·103 cites·5 claims
- 0289US7394084B2Method of generating image and illumination device for inspecting substrateOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Jul 1, 2008·20 cites·12 claims
- 0382US4894790AInput method for reference printed circuit board assembly data to an image processing printed circuit board assembly automatic inspection apparatusOMRON TATEISI ELECTRONICS CO·Filed 1987·Granted Jan 16, 1990·83 cites·15 claims
- 0479US7310406B2Inspection method and system for and method of producing component mounting substrateOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Dec 18, 2007·8 cites·3 claims
- 0575US7505149B2Apparatus for surface inspection and method and apparatus for inspecting substrateOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Mar 17, 2009·9 cites·8 claims
- 0671US5027295AApparatus for inspecting packaged electronic deviceOMRON TATEISI ELECTRONICS CO·Filed 1990·Granted Jun 25, 1991·37 cites·8 claims
- 0769US5093797AApparatus for inspecting packaged electronic deviceOMRON TATEISI ELECTRONICS CO·Filed 1988·Granted Mar 3, 1992·24 cites·18 claims
- 0867US7512260B2Substrate inspection method and apparatusOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Mar 31, 2009·5 cites·6 claims
- 0964US4953100AApparatus for inspecting packaged electronic deviceOMRON TATEISI ELECTRONICS CO·Filed 1987·Granted Aug 28, 1990·29 cites·5 claims
- 1057US7869644B2Methods of and apparatus for inspecting substrateOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Jan 11, 2011·1 cites·5 claims
- 1156US7680320B2Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection dataOMRON TATEISI ELECTRONICS CO·Filed 2005·Granted Mar 16, 2010·2 cites·4 claims
- 1240US2005209822A1Inspection method and system and production method of mounted substrateISHIBA MASATO·Filed 2005·Application pending·0 cites
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