Inventor · disambiguated record
Kazunori Koga
Also filed as: KOGA KAZUNORI
10 granted patents·5 pending applications·166 citations·filing 1977–2022
90Inventor score
Top patents by PatentIndex Score
15 records- 0188US4105455AMethod of producing dense sintered silicon carbide body from polycarbosilanesKYOTO CERAMIC·Filed 1977·Granted Aug 8, 1978·35 cites·21 claims
- 0271US4374793AMethod of producing dense sintered silicon carbide body from polycarbosilaneKYOTO CERAMIC·Filed 1978·Granted Feb 22, 1983·23 cites·22 claims
- 0369US4592237AMethod of selecting composite reception signal in ultrasonic inspection apparatus and apparatus thereforHITACHI LTD·Filed 1984·Granted Jun 3, 1986·24 cites·6 claims
- 0465US4920085ASilicon nitride sintered body and process for preparation thereofKYOCERA CORP·Filed 1988·Granted Apr 24, 1990·19 cites·12 claims
- 0561US5681995AUltrasonic flaw detecting apparatus for inspecting multi-layer structure and method thereofHITACHI LTD·Filed 1996·Granted Oct 28, 1997·30 cites·10 claims
- 0649US12476084B2Plasma processing apparatus, high-frequency power supply circuit, and impedance matching methodTOKYO ELECTRON LTD·Filed 2022·Granted Nov 18, 2025·0 cites·20 claims
- 0747US5114889ASilicon nitride sintered body and process for preparation thereofKYOCERA CORP·Filed 1990·Granted May 19, 1992·9 cites·9 claims
- 0846US4736630AApparatus and method for sending out and receiving ultrasonic wave signalsHITACHI LTD·Filed 1986·Granted Apr 12, 1988·12 cites·29 claims
- 0945US5219500ASilicon nitride sintered body and process for preparation thereofKYOCERA CORP·Filed 1989·Granted Jun 15, 1993·9 cites·6 claims
- 1043US2010097693A1Confocal microscopeKOGA KAZUNORI·Filed 2008·Application pending·0 cites
- 1138US2006269690A1Formation technology for nanoparticle films having low dielectric constantUNIV KYUSHU NAT UNIV CORP·Filed 2005·Application pending·0 cites
- 1237US2006105583A1Formation technology of nano-particle films having low dielectric constantUNIV KYUSHU NAT UNIV CORP·Filed 2004·Application pending·0 cites
- 1335US4615217ATwo-probe ultrasonic flaw detection apparatusHITACHI LTD·Filed 1985·Granted Oct 7, 1986·5 cites·9 claims
- 1434US2008008640A1Cluster-Free Amorphous Silicon Film, and Method and Apparatus for Producing the SameWATANABE YUKIO·Filed 2005·Application pending·0 cites
- 1528US2012315684A1Plasma Oxidation-Reduction Method, Method for Promoting Plant/Animal Growth Using the Same, and Plasma-Generating Device for Use in Method for Promoting Plant/Animal GrowthHAYASHI NOBUYA·Filed 2011·Application pending·0 cites
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