Inventor · disambiguated record
January Kister
Also filed as: KISTER JANUARY
65 granted patents·8 pending applications·2,614 citations·filing 1993–2025
99Inventor score
Top patents by PatentIndex Score
73 records- 0198US9316670B2Multiple contact probesFORMFACTOR INC·Filed 2015·Granted Apr 19, 2016·17 cites·10 claims
- 0298US8415963B2Low profile probe having improved mechanical scrub and reduced contact inductanceKISTER JANUARY·Filed 2011·Granted Apr 9, 2013·28 cites·21 claims
- 0397US9121868B2Probes with offset arm and suspension structureKISTER JANUARY·Filed 2012·Granted Sep 1, 2015·19 cites·38 claims
- 0497US9097740B2Layered probes with coreKISTER JANUARY·Filed 2010·Granted Aug 4, 2015·22 cites·19 claims
- 0597US8111080B2Knee probe having reduced thickness section for control of scrub motionKISTER JANUARY·Filed 2010·Granted Feb 7, 2012·17 cites·68 claims
- 0697US7649367B2Low profile probe having improved mechanical scrub and reduced contact inductanceMICROPROBE INC·Filed 2006·Granted Jan 19, 2010·32 cites·15 claims
- 0797US7514948B2Vertical probe array arranged to provide space transformationMICROPROBE INC·Filed 2007·Granted Apr 7, 2009·35 cites·17 claims
- 0897US7417447B2Probe cards employing probes having retaining portions for potting in a retention arrangementMICROPROBE INC·Filed 2008·Granted Aug 26, 2008·35 cites·6 claims
- 0997US7345492B2Probe cards employing probes having retaining portions for potting in a retention arrangementMICROPROBE INC·Filed 2005·Granted Mar 18, 2008·39 cites·15 claims
- 1097US6530148B1Method for making a probe apparatus for testing integrated circuitsKULICKE & SOFFA INVESTMENTS·Filed 2000·Granted Mar 11, 2003·89 cites·6 claims
- 1197US5720098AMethod for making a probe preserving a uniform stress distribution under deflectionPROBE TECHNOLOGY·Filed 1995·Granted Feb 24, 1998·169 cites·6 claims
- 1296US9476911B2Probes with high current carrying capability and laser machining methodsKISTER JANUARY·Filed 2012·Granted Oct 25, 2016·15 cites·18 claims
- 1396US7944224B2Low profile probe having improved mechanical scrub and reduced contact inductanceMICROPROBE INC·Filed 2010·Granted May 17, 2011·14 cites·66 claims
- 1496US7436192B2Probe skates for electrical testing of convex pad topologiesMICROPROBE INC·Filed 2007·Granted Oct 14, 2008·35 cites·25 claims
- 1596US5742174AMembrane for holding a probe tip in proper locationPROBE TECHNOLOGY·Filed 1995·Granted Apr 21, 1998·198 cites·20 claims
- 1696US5422574ALarge scale protrusion membrane for semiconductor devices under test with very high pin countsPROBE TECHNOLOGY CORP·Filed 1993·Granted Jun 6, 1995·255 cites·6 claims
- 1795USRE46221EProbe skates for electrical testing of convex pad topologiesKISTER JANUARY·Filed 2012·Granted Nov 29, 2016·13 cites·41 claims
- 1895USRE43503EProbe skates for electrical testing of convex pad topologiesKISTER JANUARY·Filed 2010·Granted Jul 10, 2012·13 cites·85 claims
- 1995US7733101B2Knee probe having increased scrub motionMICROPROBE INC·Filed 2006·Granted Jun 8, 2010·30 cites·59 claims
- 2095US7671610B2Vertical guided probe array providing sideways scrub motionMICROPROBE INC·Filed 2007·Granted Mar 2, 2010·30 cites·21 claims
- 2195US6419500B1Probe assembly having floatable buckling beam probes and apparatus for abrading the sameKULICKE & SOFFA INVESTMENT INC·Filed 1999·Granted Jul 16, 2002·89 cites·8 claims
- 2295US5764072ADual contact probe assembly for testing integrated circuitsPROBE TECHNOLOGY·Filed 1996·Granted Jun 9, 1998·128 cites·17 claims
- 2394US6525552B2Modular probe apparatusKULICKE & SOFFA INVESTMENTS·Filed 2001·Granted Feb 25, 2003·66 cites·17 claims
- 2493US7786740B2Probe cards employing probes having retaining portions for potting in a potting regionASTRIA SEMICONDUCTOR HOLDINGS·Filed 2006·Granted Aug 31, 2010·34 cites·93 claims
- 2593US7659739B2Knee probe having reduced thickness section for control of scrub motionMICRO PORBE INC·Filed 2006·Granted Feb 9, 2010·33 cites·42 claims
- 2693US7312617B2Space transformers employing wire bonds for interconnections with fine pitch contactsMICROPROBE INC·Filed 2006·Granted Dec 25, 2007·21 cites·19 claims
- 2793US6424164B1Probe apparatus having removable beam probesKULICKE & SOFFA INVESTMENT INC·Filed 2000·Granted Jul 23, 2002·61 cites·21 claims
- 2892US8324923B2Vertical probe array arranged to provide space transformationKISTER JANUARY·Filed 2011·Granted Dec 4, 2012·7 cites·31 claims
- 2992US7952377B2Vertical probe array arranged to provide space transformationMICROPROBE INC·Filed 2009·Granted May 31, 2011·14 cites·29 claims
- 3092US7217138B2Multipath interconnect with meandering contact cantileversANTARES CONTECH INC·Filed 2005·Granted May 15, 2007·30 cites·20 claims
- 3192US7189078B2See-saw interconnect assembly with dielectric carrier grid providing spring suspensionANTARES CONTECH INC·Filed 2005·Granted Mar 13, 2007·29 cites·54 claims
- 3292USD507198SStraight protruding probe beam contour surfacesK & S INTERCONNECT INC·Filed 2003·Granted Jul 12, 2005·46 cites·1 claims
- 3391US8723546B2Vertical guided layered probeKISTER JANUARY·Filed 2010·Granted May 13, 2014·9 cites·28 claims
- 3491US8203353B2Probes with offset arm and suspension structureKISTER JANUARY·Filed 2010·Granted Jun 19, 2012·7 cites·70 claims
- 3591US7759949B2Probes with self-cleaning blunt skates for contacting conductive padsMICROPROBE INC·Filed 2006·Granted Jul 20, 2010·15 cites·50 claims
- 3691US7148709B2Freely deflecting knee probe with controlled scrub motionMICROPROBE INC·Filed 2004·Granted Dec 12, 2006·47 cites·21 claims
- 3790US8230593B2Probe bonding method having improved control of bonding materialKISTER JANUARY·Filed 2008·Granted Jul 31, 2012·17 cites·28 claims
- 3890US6570396B1Interface structure for contacting probe beamsKULICKE & SOFFA INVESTMENT INC·Filed 2000·Granted May 27, 2003·44 cites·16 claims
- 3990US6064215AHigh temperature probe card for testing integrated circuitsPROBE TECHNOLOGY INC·Filed 1998·Granted May 16, 2000·82 cites·43 claims
- 4089US8907689B2Probe retention arrangementKISTER JANUARY·Filed 2010·Granted Dec 9, 2014·11 cites·23 claims
- 4189US7091729B2Cantilever probe with dual plane fixture and probe apparatus therewithMICRO PROBE·Filed 2004·Granted Aug 15, 2006·50 cites·19 claims
- 4289US6965245B2Prefabricated and attached interconnect structureK & S INTERCONNECT INC·Filed 2003·Granted Nov 15, 2005·49 cites·35 claims
- 4388USRE44407ESpace transformers employing wire bonds for interconnections with fine pitch contactsKISTER JANUARY·Filed 2009·Granted Aug 6, 2013·12 cites·68 claims
- 4488US7059865B2See-saw interconnect assembly with dielectric carrier grid providing spring suspensionK & S INTERCONNECT INC·Filed 2004·Granted Jun 13, 2006·41 cites·32 claims
- 4587US11156637B2Electrical test probes having decoupled electrical and mechanical designFORMFACTOR INC·Filed 2019·Granted Oct 26, 2021·4 cites·15 claims
- 4687US7064564B2Bundled probe apparatus for multiple terminal contactingANTARES CONTECH INC·Filed 2001·Granted Jun 20, 2006·45 cites·17 claims
- 4787US6420887B1Modulated space transformer for high density buckling beam probe and method for making the sameKULICKE & SOFFA INVESTMENT INC·Filed 2000·Granted Jul 16, 2002·69 cites·8 claims
- 4887US5884395AAssembly structure for making integrated circuit chip probe cardsPROBE TECHNOLOGY·Filed 1997·Granted Mar 23, 1999·76 cites·21 claims
- 4986US7173441B2Prefabricated and attached interconnect structureSV PROBE PTE LTD·Filed 2004·Granted Feb 6, 2007·33 cites·18 claims
- 5086US7046021B2Double acting spring probeMICROPROBE·Filed 2004·Granted May 16, 2006·37 cites·45 claims
Showing the top 50 of 73 patent records by PatentIndex Score.
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