Inventor · disambiguated record
Il-Hwan Lee
Also filed as: LEE IL-HWAN
5 granted patents·6 pending applications·56 citations·filing 2003–2023
77Inventor score
Files withMANTIZ LOGITECH CO LTD3SNU PRECISION CO LTD2CATHOLIC UNIV KOREA IND ACADEMIC COOPERATION FOUNDATION1HYUNDAI MOTOR CO LTD1ILJIN GLOBAL CO LTD1
Top patents by PatentIndex Score
11 records- 0186US10575965B2Spinal implant with unit structure printed using 3D printerMANTIZ LOGITECH CO LTD·Filed 2018·Granted Mar 3, 2020·22 cites·8 claims
- 0280US8223326B2Dark-field examination deviceKIM TAI-WOOK·Filed 2009·Granted Jul 17, 2012·17 cites·5 claims
- 0367US7113273B2Machine and method for inspecting ferrule of optical connectorPAHK HEUI-JAE·Filed 2003·Granted Sep 26, 2006·17 cites·12 claims
- 0461US2024329057A1Detection of Beta Amyloid Protein as Alzheimer's Disease-Causing Factor in Palatine Tonsil and Use ThereofCATHOLIC UNIV KOREA IND ACADEMIC COOPERATION FOUNDATION·Filed 2023·Application pending·0 cites
- 0558US2011013015A1Vision inspection system and inspection method using the sameSNU PRECISION CO LTD·Filed 2009·Application pending·0 cites
- 0657US11357883B1Method for preparing absorbable haemostatic composition for body and haemostatic composition prepared therebyMANTIZ LOGITECH CO LTD·Filed 2021·Granted Jun 14, 2022·0 cites·1 claims
- 0753US11458764B2Wheel bearing having improved sensor target and sensor target mounting portionILJIN GLOBAL CO LTD·Filed 2021·Granted Oct 4, 2022·0 cites·16 claims
- 0843US2020163775A1Four-directional extended intervertebral fusion cage deviceMANTIZ LOGITECH CO LTD·Filed 2019·Application pending·0 cites
- 0941US2010029019A1Detecting materials on wafer and repair system and method thereofSNU PRECISION CO LTD·Filed 2009·Application pending·0 cites
- 1039US2011279670A1Apparatus for Measuring Three-Dimensional Profile Using LCDPARK HEUI-JAE·Filed 2008·Application pending·0 cites
- 1133US2016377701A1System and method for detecting mounting angle of blind spot detection sensorHYUNDAI MOTOR CO LTD·Filed 2015·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →