Inventor · disambiguated record
Pamela S. Gillis
Also filed as: GILLIS PAMELA S · GILLIS PAMELA SUE
15 granted patents·363 citations·filing 1990–2011
93Inventor score
Top patents by PatentIndex Score
15 records- 0195US6577156B2Method and apparatus for initializing an integrated circuit using compressed data from a remote fuseboxIBM·Filed 2000·Granted Jun 10, 2003·106 cites·28 claims
- 0292US6768694B2Method of electrically blowing fuses under control of an on-chip tester interface apparatusIBM·Filed 2002·Granted Jul 27, 2004·84 cites·44 claims
- 0384US6058496ASelf-timed AC CIO wrap method and apparatusIBM·Filed 1997·Granted May 2, 2000·63 cites·20 claims
- 0476US8230283B2Method to test hold path faults using functional clockingGILLIS PAMELA S·Filed 2009·Granted Jul 24, 2012·9 cites·15 claims
- 0569US7281182B2Method and circuit using boundary scan cells for design library analysisIBM·Filed 2005·Granted Oct 9, 2007·6 cites·20 claims
- 0669US5719879AScan-bypass architecture without additional external latchesIBM·Filed 1995·Granted Feb 17, 1998·28 cites·13 claims
- 0767US5925143AScan-bypass architecture without additional external latchesIBM·Filed 1997·Granted Jul 20, 1999·27 cites·7 claims
- 0866US7305600B2Partial good integrated circuit and method of testing sameIBM·Filed 2003·Granted Dec 4, 2007·11 cites·19 claims
- 0960US8423844B2Dense register array for enabling scan out observation of both L1 and L2 latchesGILLIS PAMELA S·Filed 2011·Granted Apr 16, 2013·1 cites·14 claims
- 1058US8381050B2Method and apparatus for increased effectiveness of delay and transition fault testingIBM·Filed 2009·Granted Feb 19, 2013·1 cites·25 claims
- 1156US7478301B2Partial good integrated circuit and method of testing sameIBM·Filed 2008·Granted Jan 13, 2009·2 cites·9 claims
- 1252US5127008AIntegrated circuit driver inhibit control test methodIBM·Filed 1990·Granted Jun 30, 1992·16 cites·14 claims
- 1349US7010733B2Parametric testing for high pin count ASICIBM·Filed 2002·Granted Mar 7, 2006·6 cites·10 claims
- 1441US6656751B2Self test method and device for dynamic voltage screen functionality improvementIBM·Filed 2001·Granted Dec 2, 2003·3 cites·13 claims
- 1537US8181135B2Hold transition fault model and test generation methodIYENGAR VIKRAM·Filed 2009·Granted May 15, 2012·0 cites·15 claims
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