Inventor · disambiguated record
Robert W. Bassett
Also filed as: BASSETT ROBERT W
6 granted patents·1 pending application·83 citations·filing 1988–2009
83Inventor score
Top patents by PatentIndex Score
7 records- 0181US4878209AMacro performance testIBM·Filed 1988·Granted Oct 31, 1989·45 cites·14 claims
- 0267US8209141B2System and method for automatically generating test patterns for at-speed structural test of an integrated circuit device using an incremental approach to reduce test pattern countBASSETT ROBERT W·Filed 2009·Granted Jun 26, 2012·7 cites·25 claims
- 0356US6804803B2Method for testing integrated logic circuitsIBM·Filed 2001·Granted Oct 12, 2004·5 cites·25 claims
- 0452US5127008AIntegrated circuit driver inhibit control test methodIBM·Filed 1990·Granted Jun 30, 1992·16 cites·14 claims
- 0549US7010733B2Parametric testing for high pin count ASICIBM·Filed 2002·Granted Mar 7, 2006·6 cites·10 claims
- 0647US6757856B2Apparatus and method for hardware-assisted diagnosis of broken logic-test shift-registersIBM·Filed 2001·Granted Jun 29, 2004·4 cites·16 claims
- 0734US2004139377A1Method and apparatus for compact scan testingIBM·Filed 2003·Application pending·0 cites
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